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Honda, Mitsunori; Goto, Takuya*; Sakanaka, Yoshihide*; Yaita, Tsuyoshi; Suzuki, Shinichi*
AIMS Electronics and Electrical Engineering (Internet), 3(2), p.102 - 110, 2019/03
The possibility of removal and controlling crystal formation from weathered biotite (WB) in clay minerals were investigated using molten salt electrochemistry (EC) in molten NaCl-CaCl under an electrochemical reductive reaction. Cyclic Voltammogram (CV) measurements were performed in the range of +0.5 V to -2.2 V. Several peaks were confirmed in the CV spectra. The peak at -1.4 V represents a reduction reaction of Fe in WB, so we conducted an experiment at -1.4 V for 2 h to reduce Iron (Fe). The Cs removal rate after EC treatment was determined by X-ray fluorescence analysis, and almost 100% Cs removal was confirmed. To understand the effect of the reductive reaction, we performed X-ray Adsorption Fine Structure (XAFS) analysis. Before EC treatment, the Fe in WB was present as a mixture of Fe
and Fe
. After EC treatment, the presence of Fe was confirmed by XAFS analysis. Based on this finding, EC treatment is effective for reducing Fe in WB. This result indicated that FeO
formation was suppressed, and the reduction reaction was effective for controlling crystal formation.
Ito, Kenji*; Oka, Toshitaka*; Kobayashi, Yoshinori*; Shirai, Yasuharu*; Wada, Kenichiro*; Matsumoto, Masataka*; Fujinami, Masanori*; Hirade, Tetsuya; Honda, Yoshihide*; Hosomi, Hiroyuki*; et al.
Materials Science Forum, 607, p.248 - 250, 2009/00
So far no standard procedure for the positron annihilation lifetime (PAL) technique has been established. A lack of the standards has led to difficulty in ensuring the equivalency and reliability of data from different laboratories. As a first, we conducted an interlaboratory comparison of PAL measurements for metal, polymer and silica glass with agreed procedures for data recording and analysis. The PAL data recorded at different laboratories were analyzed with a single lifetime component for the metal sample and with three components for the others, respectively. Based on the results of the reported positron and ortho-positronium lifetimes, the possible sources of the uncertainties in the PAL measurements are discussed. To reduce the effect of scattered 
rays, a lead shield was placed between the detectors. The uncertainty was significantly decreased, signifying that placing lead shields between the detectors effectively reduced the false signals due to the scattered rays.
Ito, Kenji*; Oka, Toshitaka*; Kobayashi, Yoshinori*; Shirai, Yasuharu*; Wada, Kenichiro*; Matsumoto, Masataka*; Fujinami, Masanori*; Hirade, Tetsuya; Honda, Yoshihide*; Hosomi, Hiroyuki*; et al.
Journal of Applied Physics, 104(2), p.026102_1 - 026102_3, 2008/07
Times Cited Count：48 Percentile：83.5(Physics, Applied)Interlaboratory comparison of positron annihilation lifetime measurements using synthetic fused silica and polycarbonate was conducted with the participation of 12 laboratories. By regulating procedures for the measurement and data analysis the uncertainties of the positron lifetimes obtained at different laboratories were significantly reduced in comparison with those reported in the past.
Kobayashi, Yoshinori*; Ito, Kenji*; Oka, Toshitaka*; Sakaki, Koji*; Shirai, Yasuharu*; Honda, Yoshihide*; Shimazu, Akira*; Fujinami, Masanori*; Hirade, Tetsuya; Saito, Haruo*; et al.
no journal, ,
For making a standard sample of positron annihilation measurement, quartz glass and polycarbonate were measured with 12 apparatus at AIST, Chiba Univ., Tokyo Univ., Tsukuba Univ., Touhoku Univ., Tokyo Gakugei Univ. JAEA, Nitto Denko, and Toray Research Center. By regulating procedure for the measurement and data analysis the uncertainties of the positron annihilation lifetime obtained at different laboratories were significantly reduced.
Ito, Kenji*; Oka, Toshitaka*; Kobayashi, Yoshinori*; Shirai, Yasuharu*; Wada, Kenichiro*; Matsumoto, Masataka*; Fujinami, Masanori*; Hirade, Tetsuya; Honda, Yoshihide*; Hosomi, Hiroyuki*; et al.
no journal, ,
So far no standard procedure for the positron annihilation lifetime (PAL) technique has been established. A lack of the standards has led to difficulty in ensuring equivalency and reliability of data from different laboratories. Recently, as a first step toward the standardization of the PAL technique, we conducted an interlaboratory comparison of PAL measurements for fused silica, polycarbonate and metal with agreed procedures for data recording and analysis. Based on the results of the reported lifetimes, possible sources of the uncertainties in the PAL measurements is probably caused by the backscattered -rays by other detectors. We succeeded to show that inserting shields between detectors can reduce the uncertainty.
Ito, Kenji*; Oka, Toshitaka*; Kobayashi, Yoshinori*; Shirai, Yasuharu*; Wada, Kenichiro*; Matsumoto, Masataka*; Fujinami, Masanori*; Hirade, Tetsuya; Honda, Yoshihide*; Hosomi, Hiroyuki*; et al.
no journal, ,
An interlaboratory comparison for positron annihilation lifetime measurements for pure nickel, polycarbonate (PC) and fused silica was performed. Based on the reported data of positron (for nickel) and positronium (for PC and fused silica) components, the uncertainties in the PAL measurements were estimated and their possible source was discussed.
Honda, Mitsunori; Goto, Takuya*; Sakanaka, Yoshihide*; Shimoyama, Iwao; Okamoto, Yoshihiro; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
no abstracts in English
Honda, Mitsunori; Goto, Takuya*; Sakanaka, Yoshihide*; Shimoyama, Iwao; Okamoto, Yoshihiro; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
no abstracts in English
Honda, Mitsunori; Goto, Takuya*; Sakanaka, Yoshihide*; Shimoyama, Iwao; Okamoto, Yoshihiro; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
no abstracts in English
Honda, Mitsunori; Goto, Takuya*; Sakanaka, Yoshihide*; Shimoyama, Iwao; Okamoto, Yoshihiro; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
no abstracts in English
Honda, Mitsunori; Goto, Takuya*; Sakanaka, Yoshihide*; Okamoto, Yoshihiro; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
no abstracts in English
Honda, Mitsunori; Sakanaka, Yoshihide*; Goto, Takuya*; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
Honda, Mitsunori; Goto, Takuya*; Sakanaka, Yoshihide*; Hasegawa, Yuri; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
no abstracts in English
Honda, Mitsunori; Goto, Takuya*; Sakanaka, Yoshihide*; Suzuki, Shinichi; Yaita, Tsuyoshi
no journal, ,
no abstracts in English
