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Iwamoto, Osamu; Iwamoto, Nobuyuki; Kunieda, Satoshi; Minato, Futoshi; Nakayama, Shinsuke; Abe, Yutaka*; Tsubakihara, Kosuke*; Okumura, Shin*; Ishizuka, Chikako*; Yoshida, Tadashi*; et al.
Journal of Nuclear Science and Technology, 60(1), p.1 - 60, 2023/01
Times Cited Count：64 Percentile：99.99(Nuclear Science & Technology)Yamaguchi, Hisato*; Ogawa, Shuichi*; Watanabe, Daiki*; Hozumi, Hideaki*; Gao, Y.*; Eda, Goki*; Mattevi, C.*; Fujita, Takeshi*; Yoshigoe, Akitaka; Ishizuka, Shinji*; et al.
Physica Status Solidi (A), 213(9), p.2380 - 2386, 2016/09
Times Cited Count：13 Percentile：52.49(Materials Science, Multidisciplinary)We report valence-band electronic structure evolution of graphene oxide (GO) upon its thermal reduction. The degree of oxygen functionalization was controlled by annealing temperature, and an electronic structure evolution was monitored using real-time ultraviolet photoelectron spectroscopy. We observed a drastic increase in the density of states around the Fermi level upon thermal annealing at 
600
C. The result indicates that while there is an apparent bandgap for GO prior to a thermal reduction, the gap closes after an annealing around that temperature. This trend of bandgap closure was correlated with the electrical, chemical, and structural properties to determine a set of GO material properties that is optimal for optoelectronics. The results revealed that annealing at a temperature of 500C leads to the desired properties, demonstrated by a uniform and an order of magnitude enhanced photocurrent map of an individual GO sheet compared to an as-synthesized counterpart.
Ishizuka, H.*; Kawasaki, S.*; *; *;
Japanese Journal of Applied Physics, 35(10), p.5471 - 5478, 1996/10
Times Cited Count：4 Percentile：26.12(Physics, Applied)no abstracts in English
; *; Kawasaki, S.*; Ishizuka, H.*; *; *; *; *
Nuclear Instruments and Methods in Physics Research A, 375(1-3), p.396 - 400, 1996/00
Times Cited Count：4 Percentile：43.42(Instruments & Instrumentation)no abstracts in English
Ishizuka, H.*; *; Kawasaki, S.*; Musyoki, S.*; *; *;
JAERI-M 94-047, 19 Pages, 1994/03
no abstracts in English
Sakamoto, Keishi; *; Kawasaki, S.*; Kishimoto, Yasuaki; Musyoki, S.*; *; *; Ishizuka, H.*; *;
Journal of Applied Physics, 75(1), p.36 - 42, 1994/01
Times Cited Count：13 Percentile：60.48(Physics, Applied)no abstracts in English
Sakamoto, Keishi; ; *; Musyoki, S.*; Kishimoto, Yasuaki; Kawasaki, S.*; Ishizuka, H.*
Nuclear Instruments and Methods in Physics Research A, 341, p.101 - 104, 1994/00
Times Cited Count：0 Percentile：0.01(Instruments & Instrumentation)no abstracts in English
Sakamoto, Keishi; *; Kishimoto, Yasuaki; Kawasaki, S.*; Musyoki, S.*; *; *; Ishizuka, H.*;
Physical Review Letters, 70(4), p.441 - 444, 1993/01
Times Cited Count：11 Percentile：63.99(Physics, Multidisciplinary)no abstracts in English
*; Sakamoto, Keishi; *; Musyoki, S.*; *; Ishizuka, H.*; Nagashima, Takashi; Kawasaki, S.*;
JAERI-M 92-109, 68 Pages, 1992/08
no abstracts in English
Ogiwara, Norio; ; *; Sakamoto, Keishi; ; *; Ishizuka, H.*
Shinku, 35(3), p.392 - 394, 1992/00
no abstracts in English
