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standardization method; Development of irradiation silicon technology in productivity using research reactor (Joint research)Motohashi, Jun; Takahashi, Hiroyuki; Magome, Hirokatsu; Sasajima, Fumio; Tokunaga, Okihiro*; Kawasaki, Kozo*; Onizawa, Koji*; Isshiki, Masahiko*
JAEA-Technology 2009-036, 50 Pages, 2009/07
JAEA-Technology-2009-036.pdf:32.66MB
JRR-3 and JRR-4 have been providing neutron-transmutation-doped silicon (NTD-Si) by using the silicon NTD process. We have been considering to introduce the neutron filter, which is made of high-purity-titanium, into uniform doping. Silicon carbide (SiC) semiconductors doped with NTD technology are considered suitable for high power devices with superior performances to conventional Si-based devices. The impurity contents in the high-purity-titanium and SiC were analyzed by neutron activation analyses (NAA) using k standardization method. Analyses showed that the number of impurity elements detected from the high-purity-titanium and SiC were 6 and 9, respectively. Among these impurity elements, Sc detected from the high-purity-titanium and Fe detected from SiC were comparatively long half life nuclides. From the viewpoint of exposure in handling them, we need to examine the impurity control of materials.
Oshima, Takeshi; Tokunaga, Okihiro*; Isshiki, Masahiko*; Sasajima, Fumio; Ito, Hisayoshi
Materials Science Forum, 556-557, p.457 - 460, 2007/00
no abstracts in English
Morii, Yukio; Isshiki, Masahiko
Kessho Kaiseki Handobukku, p.111 - 114, 1999/09
no abstracts in English
Morii, Yukio; Isshiki, Masahiko
Radioisotopes, 45(11), p.717 - 721, 1996/11
no abstracts in English
Kanda, Keiji*; *; Isshiki, Masahiko; Baba, Osamu; Tsuruta, Harumichi
1996 Int. Meeting on Reduced Enrichment for Research and Test Reactors (RERTR), 0, 8 Pages, 1996/00
no abstracts in English
Torii, Yoshiya; Horiguchi, Yoji; ; ; ; Shigemoto, Masamitsu; Isshiki, Masahiko
UTNL-R-0333, 0, p.9.1 - 9.10, 1996/00
no abstracts in English
Kato, Masahito*; Kano, Shigeki; Inoue, Satoshi*; Isshiki, Yasushi*; Saito, Junichi*; Yoshida, Eiichi; Morinaga, Masahiko*
Nihon Kinzoku Gakkai-Shi, 57(2), p.233 - 240, 1993/00
None
Isshiki, Masahiko; Takahashi, Hidetake; Ichikawa, Hiroki; Shirai, Eiji
Nihon Genshiryoku Gakkai-Shi, 34(2), p.108 - 118, 1992/02
Times Cited Count：5 Percentile：48.18(Nuclear Science & Technology)no abstracts in English
Isshiki, Masahiko;
Japan-China Symp. on Research and Test Reactors, 11 Pages, 1988/00
no abstracts in English
Onishi, Nobuaki; Isshiki, Masahiko; Takahashi, Hidetake;
Japan-China Symp. on Research and Test Reactors, 11 Pages, 1988/00
no abstracts in English
Yamamoto, Kazuyoshi; Yamashita, Kiyonobu; Sagawa, Hisashi; Isshiki, Masahiko*
no journal, ,
no abstracts in English
Yamashita, Kiyonobu; Isshiki, Masahiko*; Sagawa, Hisashi; Yamamoto, Kazuyoshi
no journal, ,
no abstracts in English
Komeda, Masao; Yamamoto, Kazuyoshi; Sagawa, Hisashi; Isshiki, Masahiko*; Kawasaki, Kozo*; Yamashita, Kiyonobu
no journal, ,
no abstracts in English
Komeda, Masao; Yamamoto, Kazuyoshi; Magome, Hirokatsu; Isshiki, Masahiko*; Sagawa, Hisashi
no journal, ,
no abstracts in English
Yamamoto, Kazuyoshi; Komeda, Masao; Isshiki, Masahiko*; Sagawa, Hisashi; Yamashita, Kiyonobu
no journal, ,
no abstracts in English
Yamamoto, Kazuyoshi; Komeda, Masao; Sagawa, Hisashi; Isshiki, Masahiko*; Yamashita, Kiyonobu
no journal, ,
no abstracts in English
Sagawa, Hisashi; Komeda, Masao; Yamamoto, Kazuyoshi; Isshiki, Masahiko*
no journal, ,
no abstracts in English
