Refine your search:     
Report No.
 - 
Search Results: Records 1-9 displayed on this page of 9
  • 1

Presentation/Publication Type

Initialising ...

Refine

Journal/Book Title

Initialising ...

Meeting title

Initialising ...

First Author

Initialising ...

Keyword

Initialising ...

Language

Initialising ...

Publication Year

Initialising ...

Held year of conference

Initialising ...

Save select records

Journal Articles

Relationship between soft error rate in SOI-SRAM and amount of generated charge by high energy ion probes

Hazama, Masatoshi*; Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Makino, Takahiro; Hirao, Toshio*; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*; et al.

Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-10) (Internet), p.115 - 118, 2012/12

Journal Articles

Effect of a body-tie structure fabricated by partial trench isolation on the suppression of floating body effect induced soft errors in SOI SRAM investigated using nuclear probes

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Makino, Takahiro; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*; Takai, Mikio*

Nuclear Instruments and Methods in Physics Research B, 269(20), p.2360 - 2363, 2011/10

 Times Cited Count:2 Percentile:19.86(Instruments & Instrumentation)

no abstracts in English

Journal Articles

Evaluation of soft errors using nuclear probes in SOI SRAM with body-tie structure fabricated by partial trench isolation

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Makino, Takahiro; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*; Takai, Mikio*

Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.72 - 75, 2010/10

no abstracts in English

Journal Articles

Evaluation of soft error rates using nuclear probes in bulk and SOI SRAMs with a technology node of 90 nm

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Takai, Mikio*

Nuclear Instruments and Methods in Physics Research B, 268(11-12), p.2074 - 2077, 2010/06

 Times Cited Count:3 Percentile:28.83(Instruments & Instrumentation)

no abstracts in English

JAEA Reports

Investigation and design of the dismantling process of irradiation capsules containing tritium, 2; Detailed design and trial fabrication of capsule dismantling apparatus and investigation of glove box facility

Hayashi, Kimio; Nakagawa, Tetsuya; Onose, Shoji; Ishida, Takuya; Nakamichi, Masaru; Katsuyama, Kozo; Iwamatsu, Shigemi; Hasegawa, Teiji; Kodaka, Hideo; Takatsu, Hideyuki; et al.

JAEA-Technology 2009-007, 168 Pages, 2009/03

JAEA-Technology-2009-007.pdf:31.88MB

In-pile functional tests of breeding blankets have been planned by Japan Atomic Energy Agency (JAEA), using a test blanket module (TBM) which will be loaded in the International Thermonuclear Experimental Reactor (ITER). In preparation for the in-pile functional tests, JAEA has been being performed irradiation experiments of lithium titanate (Li$$_{2}$$TiO$$_{3}$$), which is the first candidate of solid breeder materials for the blanket of the demonstration reactor (DEMO) under designing in Japan. The present report describes (1) results of a detailed design and trial fabrication tests of a dismantling apparatus for irradiation capsules which were used in irradiation experiments by the Japan Materials Testing Reactor (JMTR) of JAEA, and (2) results of a preliminary investigation of a glove box facility for post-irradiation examinations (PIEs). In the detailed design of the dismantling apparatus, datailed specifications and the installation methods were examined, based on results of a conceptual design and basic design. In the trial fabrication, cutting tests were curried out by making a mockup of a cutting component. Furthermore, a preliminary investigation of a glove box facility was carried out in order to secure a facility for PIE work after the capsule dismantling, which revealed a technical feasibility.

Journal Articles

Irradiation energy dependence of ion probes on soft error rate in SOI-SRAM

Abo, Satoshi*; Mokuno, Yoshiaki*; Kinomura, Atsushi*; Onoda, Shinobu; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Takai, Mikio*

Proceedings of the 8th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-8), p.183 - 186, 2008/12

no abstracts in English

Oral presentation

Difference of soft error rates in Bulk/SOI SRAM using high energy nuclear probes

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Makino, Takahiro; Hirao, Toshio; Iwamatsu, Toshiaki*; Oda, Hidekazu*; Takai, Mikio*

no journal, , 

no abstracts in English

Oral presentation

Soft error rate in SOI SRAM with technology node of 90 nm using oxygen ion probe

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Takai, Mikio*; Hirao, Toshio; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*

no journal, , 

no abstracts in English

Oral presentation

Dependence of soft error rate in SOI SRAM on generated charge under buried oxide by high energy ion probes

Hazama, Masatoshi*; Abo, Satoshi*; Wakaya, Fujio*; Makino, Takahiro; Onoda, Shinobu; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*; Takai, Mikio*

no journal, , 

no abstracts in English

9 (Records 1-9 displayed on this page)
  • 1