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Watanabe, Tamaki*; Toyama, Takeshi*; Hanamura, Kotoku*; Imao, Hiroshi*; Kamigaito, Osamu*; Kamoshida, Atsushi*; Kawachi, Toshihiko*; Koyama, Ryo*; Sakamoto, Naruhiko*; Fukunishi, Nobuhisa*; et al.
Proceedings of 16th Annual Meeting of Particle Accelerator Society of Japan (Internet), p.1105 - 1108, 2019/07
Upgrades for the RIKEN heavy-ion linac (RILAC) involving a new superconducting linac (SRILAC) are currently underway at the RIKEN radioactive isotope beam factory (RIBF). It is crucially important to develop nondestructive beam measurement diagnostics. We have developed a beam energy position monitor (BEPM) system which can measure not only the beam position but also the beam energy simultaneously by measuring the time of flight of the beam. We fabricated 11 BEPMs and completed the position calibration to obtain the sensitivity and offset for each BEPMs. The position accuracy has been achieved to be less than 
0.1 mm by using the mapping measurement.
imaging device of high spatial resolution ZnO scintillatorNakazato, Tomoharu*; Shimizu, Toshihiko*; Yamanoi, Kohei*; Sakai, Kohei*; Takeda, Kohei*; Nishi, Ryosuke*; Minami, Yuki*; Cadatal-Raduban, M.*; Sarukura, Nobuhiko*; Nishimura, Hiroaki*; et al.
Japanese Journal of Applied Physics, 50(12), p.122202_1 - 122202_4, 2011/12
Times Cited Count：9 Percentile：38.03(Physics, Applied)We demonstrate the potential of a hydrothermal method-grown ZnO as a high-spatial resolution imaging device for in-situ soft X-ray laser diagnostics by characterizing the exciton emission patterns. By plotting the emission pattern radii at each position, we estimated the evolution of the beam radius around the focal point. The beam profile of the Ni-like Ag ion plasma laser was estimated from the waist radii as 29 and 21
m, the divergence angle as 7.2 and 11 mrad and the M2 factor as 47 and 50 in the horizontal- and vertical-axis, respectively. Spatial resolution of the magnifier was estimated to be 6m and is expected to improve by optimizing the optics of the magnifier and using a telescope. Our results would enhance the use of ZnO as an imaging device that would play a crucial role in the development and application of soft X-ray light sources.
Tanaka, Momoko; Nakazato, Tomoharu*; Shimizu, Toshihiko*; Yamanoi, Kohei*; Sakai, Kohei*; Sarukura, Nobuhiko*; Nishikino, Masaharu; Oba, Toshiyuki; Kaihori, Takeshi; Ochi, Yoshihiro; et al.
JAEA-Conf 2011-001, p.126 - 128, 2011/03
The spatial resolution of hydrothermal method grown zinc oxide (ZnO) scintillator was evaluated using X-ray laser focused with Fresnel zone plate. The fluorescence image of the ZnO scintillator was measured to be less than 10um using CCD camera coupled with a Schbartzchild expander mirror. The availability of large size ZnO crystal up to 3-inch is quite attractive for future lithography and imaging applications.
Sarukura, Nobuhiko*; Nakazato, Tomoharu*; Shimizu, Toshihiko*; Yamanoi, Kohei*; Sakai, Kohei*; Ehrentraut, D.*; Fukuda, Tsuguo*; Tanaka, Momoko; Nishikino, Masaharu; Kawachi, Tetsuya
Reza Kenkyu, 39(3), p.193 - 196, 2011/03
Development of light sources in the soft X-ray/X-ray region, such as laser induced plasma emission and XFEL, is in demand for applications in various fields of science, medicine, and industry, among others. To promote this endeavor, development of imaging devices as diagnostic tools in this wavelength region is required. ZnO is a prominent candidate material for high spatial and temporal resolution imaging devices because of its emission at 380 nm, lifetime of less than 1 ns, and availability of large and cheap but high quality crystals. We obtained a single shot image of ZnO emission pattern excited by an X-ray laser at the Advanced Photon Research Center, Japan Atomic Energy Agency. The spatial resolution was estimated to be around 10 m. This result shows that ZnO can be used as a powerful imaging device for applications such as EUV lithography.
Tanaka, Momoko; Furukawa, Yusuke*; Nakazato, Tomoharu*; Tatsumi, Toshihiro*; Murakami, Hidetoshi*; Shimizu, Toshihiko*; Sarukura, Nobuhiko*; Nishikino, Masaharu; Kawachi, Tetsuya; Kagamitani, Yuji*; et al.
X-Ray Lasers 2008; Springer Proceedings in Physics, Vol.130, p.501 - 505, 2009/00
We measured the time-resolved fluorescence spectra of ZnO and GaN single crystals excited by an X-ray laser operating at 13.9 nm and evaluated their scintillation properties for EUV excitation as compared with UV excitation case. For ZnO, a clear fluorescence peak of excitonic origin was observed at around 380 nm and the decay lifetime of less than 3 ns is found to be almost similar to the UV excitation case. The fluorescence at 380 nm is ideal for scintillator device design in the EUV and further applications. For GaN, the lifetimes are much longer than ZnO and the temporal profile of the EUV-excited fluorescence differs with the UV excitation case. As such, the EUV scintillation properties of ZnO is said to be more favorable than GaN. Finally, it is also demonstrated that an X-ray laser is an excellent tool for spectroscopic characterization of materials intended for next-generation lithography applications.
N-nitrate in transgenic rice plant over-expressing nitrate transporterSato, Daisuke*; Mori, Mari*; Katayama, Hisato*; Kitamura, Harushige*; Kawai, Toshihiko*; Fujimaki, Shu; Suzui, Nobuo; Kawachi, Naoki; Ishii, Satomi; Matsuhashi, Shimpei; et al.
JAEA-Review 2006-042, JAEA Takasaki Annual Report 2005, P. 128, 2007/02
no abstracts in English
Nakazato, Tomoharu*; Shimizu, Toshihiko*; Yamanoi, Kohei*; Takatori, Satoru*; Estacio, E.*; Cadatal, M.*; Sarukura, Nobuhiko*; Nishimura, Hiroaki*; Mima, Kunioki*; Tanaka, Momoko; et al.
no journal, ,
We have observed the single shot, focused image of a EUV laser through the emission of a ZnO scintillator. An estimated EUV laser focal spot size of 50
88 micrometer is reasonable considering the long focal length of the spherical mirror. This work reports a feasible method to perform single-shot beam diagnostics for EUV laser sources using a ZnO crystal scintillator. Furthermore, since the ZnO fluorescence is at 380 nm wavelength, the imaging optics for the diagnostics can all be placed outside the vacuum chamber; thereby making experiments less cumbersome. Having a capability in fast and efficient beam profiling of EUV laser sources with acceptable resolving power is very important in future lithography applications.
Yogo, Akifumi; Nishiuchi, Mamiko; Sakaki, Hironao; Hori, Toshihiko; Sato, Katsutoshi; Nishikino, Masaharu; Maeda, Takuya; Mori, Michiaki; Ogura, Koichi; Orimo, Satoshi; et al.
no journal, ,
no abstracts in English
Yogo, Akifumi; Sato, Katsutoshi; Nishikino, Masaharu; Maeda, Takuya; Nishiuchi, Mamiko; Sakaki, Hironao; Hori, Toshihiko; Mori, Michiaki; Ogura, Koichi; Orimo, Satoshi; et al.
no journal, ,
no abstracts in English
Nakazato, Tomoharu*; Shimizu, Toshihiko*; Yamanoi, Kohei*; Sakai, Kohei*; Sarukura, Nobuhiko*; Ehrentraut, D.*; Fukuda, Tsuguo*; Tanaka, Momoko; Nishikino, Masaharu; Yamatani, Hiroshi*; et al.
no journal, ,
no abstracts in English
