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Ogura, Shunta*; Komiyama, Takahiro*; Takahashi, Yoshihiro*; Makino, Takahiro; Onoda, Shinobu; Hirao, Toshio*; Oshima, Takeshi
Proceedings of 10th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-10) (Internet), p.127 - 129, 2012/12
We have investigated the transient current in a SOI p
n junction diode induced by single heavy-ions. The amount of radiation induced total collected charge exceeds the generated charge in active SOI layer because some of generated charge in handle substrate is collected through a BOX layer by displacement current. The displacement current is caused by the charges collected at surface of handle substrate due to an electric field in depletion layer. In this paper, we show that the amount of collected charge can be suppressed by reducing the width of depletion layer at the surface of handle substrate.
Takahashi, Yoshihiro*; Ogura, Shunta*; Komiyama, Takahiro*; Makino, Takahiro; Onoda, Shinobu; Hirao, Toshio*; Oshima, Takeshi
no journal, ,
no abstracts in English
Usui, Takahiro; Komiyama, Daisuke; Amaya, Masaki; Suzuki, Akihiro*; Terai, Takayuki*
no journal, ,
Oxidation experiments of the SiC coating on the Zry-4 plates were conducted. It was observed that the SiC coating on the Zry-4 specimens has oxidation resistance at 1200
C for 30 min. The peel-off of the coating were observed at 1000C and more. It is possible that the peel-off of the coating was affected by the reaction between SiC coating and Zry-4 substrates.