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Deng, Y.*; Watanabe, Yukinobu*; Manabe, Seiya*; Liao, W.*; Hashimoto, Masanori*; Abe, Shinichiro; Tampo, Motonobu*; Miyake, Yasuhiro*
IEEE Transactions on Nuclear Science, 71(4), p.912 - 920, 2024/04
With the miniaturization of semiconductors and the decrease in operating voltage, there is a growing interest and discussion in whether the muons in cosmic rays may be the source of single event upsets (SEUs). In the case of neutron-induced SEUs, it was reported that the irradiation side has the impact on SEU cross sections. Here, to investigate the impact of irradiation direction on muon-induced SEUs, we have measured and simulate muon-induced SEUs in 65-nm bulk SRAMs with different muon irradiation directions. It was found that the peak SEU cross section for the package side irradiation is about twice large as that for the board side irradiation. We also revealed that the difference in observed SEU cross sections between the package side and the board side irradiation is caused by differences in energy straggling due to changes in penetration depth depending on the incident direction.
Huang, Z.*; Wang, W.*; Ye, H.*; Bao, S.*; Shangguan, Y.*; Liao, J.*; Cao, S.*; Kajimoto, Ryoichi; Ikeuchi, Kazuhiko*; Deng, G.*; et al.
Physical Review B, 109(1), p.014434_1 - 014434_9, 2024/01
Times Cited Count:0 Percentile:0.01(Materials Science, Multidisciplinary)Liao, L.*; Puebla, J.*; Yamamoto, Kei; Kim, J.*; Maekawa, Sadamichi*; Hwang, Y.*; Ba, Y.*; Otani, Yoshichika*
Physical Review Letters, 131(17), p.176701_1 - 176701_6, 2023/10
Times Cited Count:2 Percentile:0(Physics, Multidisciplinary)Bao, S.*; Gu, Z.-L.*; Shangguan, Y.*; Huang, Z.*; Liao, J.*; Zhao, X.*; Zhang, B.*; Dong, Z.-Y.*; Wang, W.*; Kajimoto, Ryoichi; et al.
Nature Communications (Internet), 14, p.6093_1 - 6093_9, 2023/09
Times Cited Count:2 Percentile:57.37(Multidisciplinary Sciences)Dehbi, A.*; Cheng, X.*; Liao, Y.*; Okagaki, Yuria; Pellegrini, M.*
Proceedings of 19th International Topical Meeting on Nuclear Reactor Thermal Hydraulics (NURETH-19) (Internet), 15 Pages, 2022/03
Shangguan, Y.*; Bao, S.*; Dong, Z.-Y.*; Cai, Z.*; Wang, W.*; Huang, Z.*; Ma, Z.*; Liao, J.*; Zhao, X.*; Kajimoto, Ryoichi; et al.
Physical Review B, 104(22), p.224430_1 - 224430_8, 2021/12
Times Cited Count:1 Percentile:7.51(Materials Science, Multidisciplinary)Wang, Y.*; Wang, L.*; Zheng, H.*; Li, K.*; Andrzejewski, M.*; Hattori, Takanori; Sano, Asami; Katrusiak, A.*; Meng, Y.*; Liao, F.*; et al.
Journal of Physical Chemistry C, 120(51), p.29510 - 29519, 2016/12
Times Cited Count:23 Percentile:60.41(Chemistry, Physical)Pressure-induced polymerization (PIP) of aromatic molecules can generate saturated carbon nanostructures. As a strongly interacted - stacking unit, the CH-CF adduct is widely applied in supramolecular chemistry, and it provides a good preorganization for the PIP. Here we investigated the structural variation of CH-CF cocrystal and the subsequent PIP process under high pressure. Four new molecular-complex phases V, VI, VII, and VIII have been identified and characterized by the in situ Raman, IR, synchrotron X-ray, and neutron diffraction. The phase V is different from the phases observed at low temperature, which has a tilted column structure. Phases VI and VII have a structure similar to phase V. Phase VIII polymerizes irreversibly upon compression above 25 GPa without any catalyst, producing sp(CH/F) materials. The - interaction is still dominant below 0.5 GPa but is most likely to be overstepped under further compression, which is important for discussing the supramolecular phase transition and the polymerization process.