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JAEA Reports

Development of MeV ion microbeam technique

Kamiya, Tomihiro; Mizuhashi, Kiyoshi; Minehara, Eisuke; *; Tanaka, Ryuichi; Maruyama, Michio*; M.Koh*; *; *; *; et al.

JAERI-M 94-033, 108 Pages, 1994/03

JAERI-M-94-033.pdf:4.24MB

no abstracts in English

Journal Articles

Development of ion microprobe system at WASEDA University

M.Koh*; *; *; *; *; *; *; Kamiya, Tomihiro; *; Minehara, Eisuke; et al.

Proceedings of International Workshop on Radiation Effects of Semiconductor Devices for Spasce Application, p.105 - 111, 1992/00

no abstracts in English

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