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Narita, Hirokazu*; Nicolson, R. M.*; Motokawa, Ryuhei; Ito, Fumiyuki*; Morisaku, Kazuko*; Goto, Midori*; Tanaka, Mikiya*; Heller, W. T.*; Shiwaku, Hideaki; Yaita, Tsuyoshi; et al.
Inorganic Chemistry, 58(13), p.8720 - 8734, 2019/07
Times Cited Count：14 Percentile：69.15(Chemistry, Inorganic & Nuclear)Garcia, J.*; Hayashi, Nobuhiko; Baiocchi, B.*; Giruzzi, G.*; Honda, Mitsuru; Ide, Shunsuke; Maget, P.*; Narita, Emi*; Schneider, M.*; Urano, Hajime; et al.
Nuclear Fusion, 54(9), p.093010_1 - 093010_13, 2014/09
Times Cited Count：38 Percentile：86.63(Physics, Fluids & Plasmas)Mannan, M. A.*; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Nagano, Masamitsu*; Noguchi, Hideyuki*
Journal of Electron Spectroscopy and Related Phenomena, 181(2-3), p.242 - 248, 2010/08
Times Cited Count：5 Percentile：31.03(Spectroscopy)The ordering and molecular orientation of polydimethylsilane (PDMS) films grown on indium tin oxide (ITO) surface has been assigned. The orientation of the samples as well as that of the annealed sample was studied by Si K-edge near-edge X-ray absorption fine structure (NEXAFS) and X-ray photoelectron spectroscopy using linearly polarized synchrotron radiation. The Si K-edge NEXAFS spectra for the thick film have at least four resonance peaks of which two peaks are found to be strongly polarization dependent. On the basis of the polarization dependences of the peak intensities, it is revealed that the backbones of the PDMS films are perpendicularly oriented on the ITO surface. The angle between surface and the Si-Si bonds for multilayered film calculated from the helical structure of PDMS molecule was found to be 41.5 
which was almost coincided with the experimentally obtained angle of 40 . It was concluded that PDMS molecules are highly self-ordered on ITO surface.
Saito, Kimiaki; Saito, Hidetoshi*; Kunieda, Etsuo*; Narita, Yuichiro*; Myojoyama, Atsushi*; Fujisaki, Tatsuya*; Kawase, Takatsugu*; Kaneko, Katsutaro*; Ozaki, Masahiro*; Deloar, H. M.*; et al.
Joho Shori, 48(10), p.1081 - 1088, 2007/10
no abstracts in English
Kamiyama, Takashi*; Seki, Naoki*; Iwasa, Hirokatsu*; Uchida, Tsutomu*; Ebinuma, Takao*; Narita, Hideo*; Igawa, Naoki; Ishii, Yoshinobu; Bennington, S. M.*; Kiyanagi, Yoshiaki*
Physica B; Condensed Matter, 385-386(1), p.202 - 204, 2006/11
Times Cited Count：7 Percentile：35.05(Physics, Condensed Matter)no abstracts in English
Saito, Kimiaki; Kunieda, Etsuo*; Narita, Yuichiro*; Kimura, Hideo; Hirai, Masaaki*; Deloar, H. M.*; Kaneko, Katsutaro*; Ozaki, Masahiro*; Fujisaki, Tatsuya*; Myojoyama, Atsushi*; et al.
Radiation Protection Dosimetry, 116(1-4), p.190 - 195, 2005/12
Times Cited Count：2 Percentile：17.57(Environmental Sciences)A dose calculation system for providing accurate dose distribution in a patient body is under developing for supporting radiotherapy using photons and electrons. In this system, a sophisticated human model, a precise accelerator head model, and a Monte Carlo calculation will be utilized to perform realistic simulation. The dose distribution is calculated by this system on the ITBL computer at the dose calculation center, and the related data are transferred through a network. This system is intended to support the quality assurance of current treatments carried out in Japan. Further, this system is planned to apply to advanced radiotherapy. The project started on November 2003 and is scheduled to continue for five years. Prototypes of some parts constituting the system have been already developed, and the fundamental features on the radiation fields have been investigated. On the basis of the fundamental investigation, the final system will be designed and constructed.
experimentOkajima, Shigeaki; Narita, M.*; Kobayashi, Keiji*
Annals of Nuclear Energy, 14(12), p.673 - 676, 1987/12
Times Cited Count：2 Percentile：40.26(Nuclear Science & Technology)When a low power meter for a reactor is calibrated by using the Feynman- methode, the absolute power is obtained by the product of the power deduced from the one-point reactor formula and the 
-factor which was introduced as the spatila correction factor on the Rossi- measurement. In this paper, for the purpose of ezperimental usage, formulae of the -factor for the different geometries are derived by one speed approximation and its characteristics are systematically surveyed. A simple formula of the -factor for a spherical core is presented and applied. This formula can estimate the value of the -factor with appropriate accuracy.
Seki, Naoki*; Kamiyama, Takashi*; Kiyanagi, Yoshiaki*; Iwasa, Hirokatsu*; Hiraga, Fujio*; Uchida, Tsutomu*; Igawa, Naoki; Yamauchi, Hiroki; Ishii, Yoshinobu; Ebinuma, Takao*; et al.
no journal, ,
no abstracts in English
Saito, Kimiaki; Kunieda, Etsuo*; Narita, Yuichiro*; Kaneko, Katsutaro*; Hirai, Masaaki*; Oku, Yohei*; Deloar, H. M.*; Fujisaki, Tatsuya*; Myojoyama, Atsushi*; Saito, Hidetoshi*
no journal, ,
no abstracts in English
Mannan, M. A.; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Nagano, Masamitsu*; Noguchi, Hideyuki*
no journal, ,
The electronic structure and molecular orientation of polydimethylsilane (PDMS) film evaporated on indium tin oxide (ITO) surface have been assigned. The film has been synthesized by high vacuum electron bombardment evaporation technique. The orientation and electronic structure of the film as well as those of the annealed sample were studied by Si K-edge NEXAFS and X-ray photoelectron spectroscopy. The Si K-edge NEXAFS spectra for the thick film have at least four resonance peaks of which two peaks are found to be strongly polarization dependent. The lower-energy resonance peak at 1842.0 eV has short-axis polarization corresponding to the resonance excitation from Si 1s to s* (pyz), and the higher-energy resonance peak at 1843.2 eV has long-axis polarization due to the excitation of Si 1s to s* (px). On the basis of the polarization dependences, it is revealed that the backbones of the PDMS polymers are perpendicularly oriented to the ITO surface.
Mannan, M. A.; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Nagano, Masamitsu*; Noguchi, Hideyuki*
no journal, ,
no abstracts in English
Mannan, M. A.; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Nagano, Masamitsu*; Noguchi, Hideyuki*
no journal, ,
no abstracts in English
Shinto, Katsuhiro; Ohira, Shigeru; Kikuchi, Takayuki; Kubo, Takashi; Yonemoto, Kazuhiro; Kasuya, Kenichi; Maebara, Sunao; Takahashi, Hiroki; Kojima, Toshiyuki; Tsutsumi, Kazuyoshi; et al.
no journal, ,
no abstracts in English
Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Mannan, M. A.*; Koswattage, K.
no journal, ,
Recently much higher-quality thin films are needed in the field of organic semiconductor development. We report on the project started recently: Method to map direction of chemical -bonds in nanometer scale. We are striving to develop a unique instrument to measure polarization-angle dependence of Near-edge X-ray absorption fine structure (NEXAFS) spectra at nano-meter level using photoelectron emission microscopy (PEEM), in order to understand creation and growth mechanisms of oriented domains. It is possible to measure XAFS spectra of microscopic regions magnified by the PEEM scope. The most unique point is the fact that the PEEM column can be rotated along the axis of synchrotron beam, so that one can measure polarization-angle dependences of such micro-XAFS spectra. Moreover, we demonstrate that other experimental and theoretical methods which provide complementary information for chemical and electronic states of organic films.
Mannan, M. A.*; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Nagano, Masamitsu*; Noguchi, Hideyuki*
no journal, ,
The electric and optical properties in thin films of one-dimensional polymers strongly depend on the molecular orientation, so the molecular orientations of polydimethylsilane (PDMS) on various metal and semiconductor surfaces have been investigated. The substrates investigated were copper, highly oriented pyrolytic graphite (HOPG), and indium tin oxide (ITO). The orientations were studied by Si K-edge near-edge X-ray absorption fine structure (NEXAFS). Polarization dependences of the NEXAFS spectra showed that the PDMS molecules are self-ordered and the backbones of the polymers are perpendicularly oriented on copper and ITO surfaces. While, it was found that the molecular orientation of PDMSs on HOPG surface is reverse to those on copper and ITO surfaces, i.e., nearly parallel to the HOPG surface. It was concluded that the flatness of the surface determines the orientation of the first layer, and the orientation of the succeeding layers follow the first layer.
Mannan, M. A.*; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Noguchi, Hideyuki*; Nagano, Masamitsu*
no journal, ,
no abstracts in English
Mannan, M. A.; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Nagano, Masamitsu*; Noguchi, Hideyuki*
no journal, ,
no abstracts in English
Sekiguchi, Tetsuhiro; Baba, Yuji; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Mannan, M. A.*; Koswattage, K.
no journal, ,
We report on a new analytical system we are recently developing in order to clarify creation and growth mechanisms of orientation of organic semiconductors in nano-meter scale. Using the instrument, it is possible to measure polarization angle dependence of X-ray absorption fine structure (XAFS) spectra at nano-meter level using photoelectron emission microscopy; thus, it probes direction of chemical -bonds in nanometer scale. We report on fundamental studies of silicon phthalocyanine thin films, which we first try to clarify orientation mechanism of the organic semiconductor. Samples were prepared by wet-based methods followed by annealing. XAFS spectra and their angle dependent data are well understood by core-excited electronic states calculated under Z+1 approximation model. We have found that one-dimensional polymers are synthesized on the substrate, where phthalocyanine planes are stacked face-to-face, and that the chain axis is perpendicular to the substrate.
Mannan, M. A.; Baba, Yuji; Sekiguchi, Tetsuhiro; Shimoyama, Iwao; Hirao, Norie; Narita, Ayumi; Nagano, Masamitsu*; Noguchi, Hideyuki*
no journal, ,
no abstracts in English
Fujii, Kentaro; Izumi, Yudai; Narita, Ayumi; Yokoya, Akinari; Herv
du Penhoat, M.-A.*; Touati, A.*; Vuilleumier, R.*; Gaigeot, M.-P.*; Politis, M.-F.*
no journal, ,
no abstracts in English
