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Journal Articles

Effect of rattling motion without cage structure on lattice thermal conductivity in LaOBiS$$_{2-x}$$Se$$_x$$

Lee, C. H.*; Nishida, Atsuhiro*; Hasegawa, Takumi*; Nishiate, Hirotaka*; Kunioka, Haruno*; Kawamura, Seiko; Nakamura, Mitsutaka; Nakajima, Kenji; Mizuguchi, Yoshikazu*

Applied Physics Letters, 112(2), p.023903_1 - 023903_4, 2018/01

 Times Cited Count:27 Percentile:78.25(Physics, Applied)

Low energy phonons in LaOBiS$$_{2-x}$$Se$$_x$$ are studied using inelastic neutron scattering. Dispersionless flat phonon branches that are mainly associated with a large vibration of Bi atoms are observed at a relatively low energy of $$E$$ = 6 - 6.7 meV. The phonon energy softens upon Se doping owing to its heavier atomic mass than S atom and the expansion of lattice constant. Simultaneously, the lattice thermal conductivity lowered upon Se doping as the same manner of the phonon softening. These suggest that despite the lack of an oversized cage in LaOBiS$$_{2-x}$$Se$$_x$$, rattling motions of Bi atoms can scatter phonon like rattling in cage compounds, contributing to enhance the thermoelectric property.

Journal Articles

Development of a negative hydrogen ion source for spatial beam profile measurement of a high intensity positive ion beam

Shinto, Katsuhiro; Wada, Motoi*; Nishida, Tomoaki*; Demura, Yasuhiro*; Sasaki, Daichi*; Tsumori, Katsuyoshi*; Nishiura, Masaki*; Kaneko, Osamu*; Kisaki, Masashi*; Sasao, Mamiko*

AIP Conference Proceedings 1390, p.675 - 683, 2011/09

 Times Cited Count:0 Percentile:0.19

Oral presentation

High energy beam profile diagnostics by using a negative ion probe beam, 2

Shinto, Katsuhiro; Wada, Motoi*; Nishida, Tomoaki*; Demura, Yasuhiro*; Sasaki, Daichi*; Tsumori, Katsuyoshi*; Kisaki, Masashi*; Nishiura, Masaki*; Kaneko, Osamu*; Sasao, Mamiko*

no journal, , 

no abstracts in English

Oral presentation

Development of a beam profile monitor using a negative ion probe beam for high intensity positive ion beams

Shinto, Katsuhiro; Wada, Motoi*; Nishida, Tomoaki*; Kisaki, Masashi*; Tsumori, Katsuyoshi*; Nishiura, Masaki*; Kaneko, Osamu*; Sasao, Mamiko*

no journal, , 

We have proposed a negative ion beam probe system as a new scheme to diagnose beam profiles of high power positive ion beams. We show the present status of the proof-of-principle experiment for the negative ion beam probe system performed at NIFS NBI test stand. A negative hydrogen ion source which produces a rectangular shape beam was installed at the diagnostic chamber in the NBI test stand and the total current of H$$^-$$ beam extracted from the ion source was measured. We obtained the total H$$^-$$ beam current of 10 $$mu$$A with the beam energy of 3 kV.

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