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Journal Articles

X-ray topography of piezoelectric La$$_3$$Ta$$_{0.5}$$Ga$$_{5.5}$$O$$_{14}$$ crystal grown by Czochralski method

Yoneda, Yasuhiro; Mizuki, Junichiro; Takeda, Hiroaki*; Shiosaki, Tadashi*

IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control, 55(5), p.971 - 974, 2008/05

We performed synchrotron X-ray topography on a La$$_3$$Ta$$_{0.5}$$Ga$$_{5.5}$$O$$_{14}$$ (LTG) crystal grown by the Czochralski (Cz) method. Since the synchrotron X-ray source can provide high-energy X-rays, one can detect bulk-sensitive information by the X-ray topography. LTG is one of the most attractive piezoelectric crystals like La$$_{3}$$Ga$$_{5}$$SiO$$_{14}$$ (LGS), because of excellent acoustic properties (temperature compensation of acoustic losses). Since LTG single crystals can be grown from stoichiometric melt, single crystals with good crystal quality can be obtained comparing to LGS which can not be grown from stoichiometric system but from congruent melt. The 60-keV X-ray topography revealed that the LTG crystal quality was not the same crystalline quality. The crystal quality of a center parts was worse than that of surroundings.

Journal Articles

Difference between local and average structures of La$$_3$$Ga$$_5$$SiO$$_{14}$$ crystal

Yoneda, Yasuhiro; Takeda, Hiroaki*; Shiosaki, Tadashi*; Mizuki, Junichiro

Japanese Journal of Applied Physics, Part 1, 46(10B), p.7163 - 7166, 2007/10

https://doi.org/10.1143/JJAP.46.7163
 Times Cited Count：1 Percentile：5.41(Physics, Applied)

The langasite (La$$_3$$Ga$$_5$$SiO$$_{14}$$, LGS) crystal grown by the Czochralski technique was investigated by X-ray diffraction measurements. The X-ray diffraction profiles of the LGS were consisted with sharp Bragg peaks and large amount of diffuse scatterings. The diffuse scattering inducated the existence of the local structure which is different from the average structure. The local structure was analyzed by the pair-distrivution function method. The local structure fluctuated by the chemical ordering of Ga and Si, and the local disordering feature of La.

Journal Articles

X-ray topography on piezoelectric La$$_3$$Ga$$_5$$SiO$$_{14}$$ single crystal

Yoneda, Yasuhiro; Okajima, Yuka; Takeda, Hiroaki*; Shiosaki, Tadashi*; Mizuki, Junichiro

Transactions of the Materials Research Society of Japan, 31(1), p.7 - 10, 2006/03

no abstracts in English

Oral presentation

X-ray topography on La$$_3$$Ta$$_{0.5}$$Ga$$_{5.5}$$O$$_{14}$$ single crystal

Yoneda, Yasuhiro; Okajima, Yuka; Mizuki, Junichiro; Takeda, Hiroaki*; Shiosaki, Tadashi*

no journal, , 

no abstracts in English

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