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Journal Articles

Radiation hardness evaluation of SiC-BGSIT

Tanaka, Yasunori*; Onoda, Shinobu; Takatsuka, Akio*; Oshima, Takeshi; Yatsuo, Tsutomu*

Materials Science Forum, 645-648, p.941 - 944, 2010/04

no abstracts in English

Oral presentation

Total ionizing dose tolerance of silicon carbide buried gate static induction transistors up to 10 MGy

Onoda, Shinobu; Oshima, Takeshi; Tanaka, Yasunori*; Takatsuka, Akio*; Yatsuo, Tsutomu*

no journal, , 

no abstracts in English

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