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Ichimaru, Satoshi*; Takenaka, Hisataka*; Namikawa, Kazumichi*; Gullikson, E. M.*; Maruyama, Momoko; Oku, Satoshi*
Review of Scientific Instruments, 86(9), p.093106_1 - 093106_7, 2015/09
Times Cited Count:3 Percentile:15.04(Instruments & Instrumentation)A graded and broadband Mo/Si multilayer mirror for EUV spectroscopy is demonstrated. This mirror has an average reflectivity profile of 16% in the wavelength region from 15 nm to 17 nm and an effective area of 1100 - 1500 mm. This reflectivity is about 4 times larger than that of a standard Mo/Si multilayer mirror on a 1 in. diameter substrate, showing that the mirror can be used for measuring EUV fluorescence at wavelengths in the region around 15 nm to 17 nm.
Koike, Masato; Ishino, Masahiko; Imazono, Takashi; Sano, Kazuo*; Sasai, Hiroyuki*; Hatayama, Masatoshi*; Takenaka, Hisataka*; Heimann, P. A.*; Gullikson, E. M.*
Spectrochimica Acta, Part B, 64(8), p.756 - 760, 2009/08
Times Cited Count:9 Percentile:43.04(Spectroscopy)W/C and Co/SiO multilayer laminar-type holographic plane gratings (groove density 1/1200 lines /mm) in the 1-8 keV region are developed. For the Co/SiO grating the diffraction efficiencies of 0.41 and 0.47 at 4 and 6 keV, respectively, and for the W/C grating 0.38 at 8 keV are observed. Taking advantage of the outstanding high diffraction efficiencies into practical soft X-ray spectrographs a Mo/SiO multilayer varied-line-spacing (VLS) laminar-type spherical grating (1/2400 lines /mm) is also developed for use with a flat field spectrograph in the region of 1.7 keV. For the Mo/SiO multilayer grating the diffraction efficiencies of 0.05-0.20 at 0.9-1.8 keV are observed. The FWHM's of the measured line profiles of Hf-M (1644.6 eV), Si-K (1740.0 eV),and W-M (1775.4 eV) are 13.7 eV, 8.0 eV, and 8.7 eV, respectively. It shows the validity of multilayer lamina-type gratings in the region.
Koike, Masato; Ishino, Masahiko; Heimann, P. A.*; Imazono, Takashi; Takenaka, Hisataka*; Hatayama, Masatoshi*; Sasai, Hiroyuki*; Gullikson, E. M.*; Sano, Kazuo*
AIP Conference Proceedings 879, p.647 - 650, 2007/01
no abstracts in English
Ishino, Masahiko; Heimann, P. A.*; Sasai, Hiroyuki*; Hatayama, Masatoshi*; Takenaka, Hisataka*; Sano, Kazuo*; Gullikson, E. M.*; Koike, Masato
Applied Optics, 45(26), p.6741 - 6745, 2006/09
Times Cited Count:12 Percentile:50(Optics)no abstracts in English
Ishino, Masahiko; Yoda, Osamu; Takenaka, Hisataka*; Sano, Kazuo*; Koike, Masato
Surface & Coatings Technology, 169-170(1-3), p.628 - 631, 2003/06
no abstracts in English
Tang, H.; Daido, Hiroyuki; Kishimoto, Maki; Sukegawa, Kota*; Tai, R.; Mesesson, S.*; Tanaka, Momoko; Lu, P.; Kawachi, Tetsuya; Nagashima, Keisuke; et al.
Japanese Journal of Applied Physics, 42(2A), p.443 - 448, 2003/02
Times Cited Count:14 Percentile:50.41(Physics, Applied)no abstracts in English
Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*
Japanese Journal of Applied Physics, Part 1, 41(6B), p.4250 - 4252, 2002/06
Times Cited Count:9 Percentile:38.09(Physics, Applied)no abstracts in English
Koike, Masato; Sano, Kazuo*; Yoda, Osamu; Harada, Yoshihisa*; Ishino, Masahiko; Moriya, Naoji*; Sasai, Hiroyuki*; Takenaka, Hisataka*; Gullikson, E. M.*; Mrowka, S.*; et al.
Review of Scientific Instruments, 73(3), p.1541 - 1544, 2002/03
Times Cited Count:20 Percentile:68.4(Instruments & Instrumentation)no abstracts in English
Tanaka, Momoko; Kawachi, Tetsuya; Kado, Masataka; Hasegawa, Noboru; Sukegawa, Kota*; Lu, P.; Nagashima, Keisuke; Kato, Yoshiaki; Takenaka, Hisataka*
Surface Review and Letters, 9(1), p.641 - 644, 2002/02
Times Cited Count:12 Percentile:53.25(Chemistry, Physical)no abstracts in English
Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*
Advances in X-Ray Chemical Analysis, Japan, 33, p.145 - 154, 2002/00
no abstracts in English
Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*
Advanced Light Source Compendium of User Abstracts 2000, 10 Pages, 2001/07
no abstracts in English
Tanaka, Momoko; Kawachi, Tetsuya; Kado, Masataka; Hasegawa, Noboru; Sukegawa, Kota*; Nagashima, Akira; Kato, Yoshiaki; Takenaka, Hisataka*
Journal de Physique, IV, 11(Pr.2), p.55 - 57, 2001/07
no abstracts in English
Takenaka, Hisataka*; Nagai, Komei*; Ito, Hisashi*; Muramatsu, Yasuji; Kawamura, T.*; Gullikson, E. M.*; Perera, R. C. C.*
Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.337 - 340, 2001/07
Times Cited Count:8 Percentile:52.41(Instruments & Instrumentation)no abstracts in English
Takenaka, Hisataka*; Ito, Hisashi*; Nagai, Komei*; Muramatsu, Yasuji; Gullikson, E. M.*; Perera, R. C. C.*
Nuclear Instruments and Methods in Physics Research A, 467-468(Part1), p.341 - 344, 2001/07
Times Cited Count:24 Percentile:83.32(Instruments & Instrumentation)no abstracts in English
Muramatsu, Yasuji; Takenaka, Hisataka*; Ueno, Yuko*; Gullikson, E. M.*; Perera, R. C. C.*
Applied Physics Letters, 77(17), p.2653 - 2655, 2000/10
Times Cited Count:13 Percentile:51.54(Physics, Applied)no abstracts in English
Koike, Masato; Ishino, Masahiko; Sano, Kazuo*; Takenaka, Hisataka*; Hatayama, Masatoshi*; Sasai, Hiroyuki*; Heimann, P. A.*; Gullikson, E. M.*
no journal, ,
no abstracts in English
Koike, Masato; Ishino, Masahiko; Sano, Kazuo*; Takenaka, Hisataka*; Hatayama, Masatoshi*; Heimann, P. A.*; Gullikson, E. M.*; Sasai, Hiroyuki*
no journal, ,
no abstracts in English
Koike, Masato; Ishino, Masahiko; Takenaka, Hisataka*; Hatayama, Masatoshi*; Sano, Kazuo*; Heimann, P. A.*; Gullikson, E. M.*
no journal, ,
no abstracts in English
Ishino, Masahiko; Koike, Masato; Heimann, P. A.*; Sasai, Hiroyuki*; Hatayama, Masatoshi*; Takenaka, Hisataka*; Sano, Kazuo*; Gullikson, E. M.*
no journal, ,
no abstracts in English
Koike, Masato; Ishino, Masahiko; Heimann, P. A.*; Gullikson, E. M.*; Takenaka, Hisataka*; Hatayama, Masatoshi*; Sasai, Hiroyuki*; Sano, Kazuo*
no journal, ,
no abstracts in English