Critical charge dependence of correlation of different neutron sources for soft error testing

Mori, Hiroko*; Uemura, Taiki*; Matsuyama, Hideya*; Abe, Shinichiro; Watanabe, Yukinobu*

no journal, , 

Terrestrial neutron-induced soft error has been recognized as a serious reliability problem for microelectronics. An irradiation testing with spallation neutron beam is suitable for evaluation of terrestrial neutron induced soft error rate (SER). The SER measured in neutron irradiation facility is necessary to compensate since neutron beam spectra obtained each facility is different from terrestrial neutron spectrum reported by JEDEC. We provide SER ratio between JEDEC's and facility's as a function of critical charge so as to compensate SER in various devices. The SER ratio was derived from single event upset (SEU) cross-section calculated by a multi-scale Monte Carlo simulation code system PHYSERD (PHits-HYenexss integrated code System for Effects of Radiation on Device). We performed SER testing using spallation neutron beam at three facilities. The deviation among measured SERs compensated by the SER ratio is less than 5%.