New precise measurement of muonium hyperfine structure interval at J-PARC

Ueno, Yasuhiro*; Aoki, Masaharu*; Fukao, Yoshinori*; Higashi, Yoshitaka*; Higuchi, Takashi*; Iinuma, Hiromi*; Ikedo, Yutaka*; Ishida, Katsuhiko*; Ito, Takashi; Iwasaki, Masahiko*; et al.

Hyperfine Interactions, 238(1), p.14_1 - 14_6, 2017/11

https://doi.org/10.1007/s10751-016-1381-7

Development of multilayer mirrors for use in the wavelength region of 4 nm

Ishino, Masahiko; Yoda, Osamu*; Koike, Masato

JAERI-Research 2005-019, 13 Pages, 2005/09

JAERI-Research-2005-019.pdf:1.46MB

We have developed soft X-ray multilayer mirrors for use around the wavelength region of 4 nm including the K-absorption edge of carbon (). We have chosen CoO and Cr as the final candidate materials for absorber layers, and SiO and Sc for the spacer materials as the result of theoretical invitation. CoO/SiO, CoO/Sc and Cr/Sc multilayer mirrors have been fabricated by means of an ion beam sputtering (IBS) method. As the result of structure evaluations with X-ray diffraction measurement, we have found that the fabricated CoO/Sc and Cr/Sc multilayer mirrors have stable structures. Soft X-ray reflectivity measurements for fabricated multilayer mirrors are carried out in the wavelength region of 4 nm with a synchrotron radiation source. We have found that the Cr/Sc multilayer mirror has a high soft X-ray reflectivity. However, soft X-ray reflectivities below the absorption edge of carbon are reduced. The analyses obtained by EPMA and SIMS suggested that this phenomenon was attributed to contamination of carbon.

Fabrication of multilayer mirrors consisting of oxide and nitride layers for continual use across the K-absorption edge of carbon

Ishino, Masahiko; Yoda, Osamu

Applied Optics, 43(9), p.1849 - 1855, 2004/03

https://doi.org/10.1364/AO.43.001849

The development of multilayer mirrors for continual use around the K-absorption edge of carbon (4.4 nm) has been begun. CoO, SiO, and BN are found to be suitable for multilayer mirrors based on theoretical calculations for wavelengths around the carbon K-absorption edge region. X-ray reflectivity curves with Cu X rays of the fabricated CoO/SiO multilayers have sharp Bragg peaks and the layer structures evaluated from TEM observations are uniform. On the other hand, the Bragg peaks of CoO/BN multilayers split and aggregated CoO is observed. To improve the CoO layer structure, CrO was mixed into CoO. The mixed oxide layer structure in the Mix/BN multilayer (Mix = CoO + CrO) is relatively uniform and the Bragg peaks do not split.

Heat stability of Mo/Si multilayers inserted with silicon oxide layers

Ishino, Masahiko; Yoda, Osamu; Sano, Kazuo*; Koike, Masato

X-Ray Mirrors, Crystals, and Multilayers II (Proceedings of SPIE Vol.4782), p.277 - 284, 2002/12

no abstracts in English

New type of Monk-Gillieson monochromator capable of covering a 0.7- to 25-nm range

Koike, Masato; Sano, Kazuo*; Harada, Yoshihisa*; Yoda, Osamu; Ishino, Masahiko; Tamura, Keisuke*; Yamashita, Kojun*; Moriya, Naoji*; Sasai, Hiroyuki*; Jinno, Masafumi*; et al.

X-Ray Mirrors, Crystals, and Multilayers II (Proceedings of SPIE Vol.4782), p.300 - 307, 2002/07

For the purpose of realizing an evaluation beamline for characterizing soft X-ray optical elements in a wide wavelength range of 0.7-25 nm, we have designed and constructed a new type of monochromator that combined two types of Monk-Gillieson monochromators. One is a conventional type equipped with three varied-line-spacing plane gratings, allowing a choice of two included angles. The other is a new type that employs a scanning mechanism based on Surface Normal Rotation (SNR). The SNR scheme provides high throughput at short wavelengths and simple scanning mechanism by means of a grating rotation about its normal. The monochromator is operated in the SNR and conventional modes over the ranges of 0.7-2.0 nm and 2.0-25 nm, respectively. In this paper we describe the optical and mechanical designs of the monochromator, wavelength calibrations in the SNR mode, and preliminary experimental data, such as the transmittance of an Al filter at 0.8 nm and the total yield photoelectron measurement on a MgO powder in a wavelength rage of 0.7-2 nm.

New evaluation beamline for soft X-ray optical elements

Koike, Masato; Sano, Kazuo*; Yoda, Osamu; Harada, Yoshihisa*; Ishino, Masahiko; Moriya, Naoji*; Sasai, Hiroyuki*; Takenaka, Hisataka*; Gullikson, E. M.*; Mrowka, S.*; et al.

Review of Scientific Instruments, 73(3), p.1541 - 1544, 2002/03

https://doi.org/10.1063/1.1445489

no abstracts in English

Design and manufacture of a testing device for the evaluation of optical elements

Shimizu, Yuichi; Yoda, Osamu; Sasuga, Tsuneo*; Teraoka, Yuden; Yokoya, Akinari; Yanagihara, Mihiro*

JAERI-Tech 2000-021, p.45 - 0, 2000/03

JAERI-Tech-2000-021.pdf:3.01MB

no abstracts in English

Time resolved measurement of laser-ablated particles by LAPXAS

Miyashita, Atsumi; Yoda, Osamu; *

Hyomen Kagaku, 20(3), p.180 - 185, 1999/00

https://doi.org/10.1380/jsssj.20.180

no abstracts in English

XPS and optical absorption studies on -AlO and MgO single crystals implanted with Cr, Cu and Kr ions

*; Aoki, Yasushi; Yoda, Osamu; Nagai, Shiro

Nuclear Instruments and Methods in Physics Research B, 88, p.261 - 266, 1994/00

https://doi.org/10.1016/0168-583X(94)95322-8

no abstracts in English

XPS studies on the charge states of Cr and Cu atoms implanted into -AlO and MgO single crystals

*; Aoki, Yasushi; Yoda, Osamu; Nagai, Shiro; D.M.Rueck*

Nuclear Instruments and Methods in Physics Research B, 80-81, p.1168 - 1170, 1993/00

https://doi.org/10.1016/0168-583X(93)90757-W

no abstracts in English