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Yonaga, Yusuke; Sano, Naomi*; Amamiya, Hiroki*; Ogita, Yasuhiro; Niwa, Masakazu; Yasue, Kenichi*
Oyo Chishitsu, 62(1), p.2 - 12, 2021/04
Provenance analysis based on quick identification of heavy minerals using an electron probe microanalyzer (EPMA) was applied to samples from Pleistocene sediments in Horonobe region, Hokkaido, where major provenance rocks can be sedimentary and mafic igneous rocks. The concentrations of 16 elements were measured in individual grains to identify the mineral species based on their chemical composition. In addition, microscopic observation of thin sections and gravel composition analysis were conducted to confirm the validity of the quick identification of heavy minerals. These analyses clarify that combinations of several heavy mineral species can be a useful index of provenance rocks from the Soya Hill and Teshio Mountains, and suggest that uplift of the Soya Hill after ca. 1.5 Ma constrained supply of sediments from the Teshio Mountains. On the other hand, minerals uncommon both in the Soya Hill and Teshio Mountains, such as hornblende, are included in the Pleistocene sediments. This suggests that a sediment supply from distant area was also significant, like transportation by the Teshio River. The method for quick identification of heavy minerals using EPMA can provide an information about provenance rocks difficult to identify only by gravel composition analysis.
Yonaga, Yusuke; Yoshikawa, Kiyotaka*; Shimada, Koji
JAEA-Testing 2020-002, 19 Pages, 2020/05
Rock thin sections are used for instrument analyses such as EPMA, LA-ICP-MS as well as microstructural observations by optical microscope. Fabrication of thin section, reported here, is one of the fundamental techniques in classical and state-of-the-art geological research. This report provides not only general procedure but also some ingenuity, precautions and equipment maintenance with visual exemplification for first-time or inexperienced users in the Tono Geoscience Center.
Niwa, Masakazu; Amamiya, Hiroki*; Yonaga, Yusuke; Ogita, Yasuhiro; Yasue, Kenichi*; Iwano, Hideki*; Danhara, Toru*; Hirata, Takafumi*
Chishitsugaku Zasshi, 126(5), p.267 - 283, 2020/05
U-Pb and fission-track (FT) ages from single zircon grain were measured for three tephra samples (TKB3, TKB6, and TKB7) intercalated in Neogene to Quaternary in Horonobe area, Hokkaido, to understand their depositional ages. In TKB3 and TKB6, weighed average U-Pb and FT ages for zircon grains within the youngest age range are coincident within a range of error 2 each other, which suggest that their ages correspond to the eruption ages. In TKB7, FT ages for most zircons are reset to their U-Pb ages or younger. The weighed average FT age for all analyzed zircons and weighed average U-Pb age for zircon grains within the youngest age range are coincident within a range of error 2 each other. Thus, their ages could also show the eruption age.
Kokubu, Yoko; Matsushi, Yuki*; Ishizaka, Chika*; Hirao, Noriaki*; Yonaga, Yusuke; Yoshikawa, Kiyotaka*
JAEA-Testing 2019-002, 101 Pages, 2019/11
This report provides a description of sample preparation method for measurement of in-situ belliyum-10 (Be) and allumium-26 (Al) in terrestrial quartz using accelerator mass spectrometry at Tono Geoscience Center, Japan Atomic Energy Agency. The report is based on the laboratory manual "Chemistry for in-situ Be and Al measurement for terrestrial quartz by AMS at MALT ver.1.3 and ver.2.2" prepared by ph.D Matsushi at Kyoto University.
Yonaga, Yusuke; Shimizu, Mayuko; Sano, Naomi; Ueki, Tadamasa; Yoshikawa, Kiyotaka*; Niwa, Masakazu
JAEA-Testing 2018-001, 29 Pages, 2018/07
Study on the formation process of mountains provides important clues for evaluating the uplift and erosion related to long-term changes of geological environment for geological disposal. Provenance analysis of detrital sediments is often be effective to understand the process. In the Tono Geoscience Center, quick and efficient mineralogical and chemical analyses for heavy minerals in basement rocks and sediments have been developed using the electron probe microanalyzer (JEOL JXA-8530F EPMA), as one of the promising tool for provenance analysis. To contribute evaluation of the analyses, sample preparation and EPMA analyses of heavy minerals were shown in this paper.
Shimizu, Mayuko; Sano, Naomi; Ueki, Tadamasa; Yonaga, Yusuke; Niwa, Masakazu
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Shimizu, Mayuko; Sano, Naomi; Ueki, Tadamasa; Yonaga, Yusuke; Yasue, Kenichi*; Niwa, Masakazu
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Ueki, Tadamasa; Shimizu, Mayuko; Sano, Naomi; Yonaga, Yusuke
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no abstracts in English
Ueki, Tadamasa; Niwa, Masakazu; Yonaga, Yusuke
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Ueki, Tadamasa; Niwa, Masakazu; Yonaga, Yusuke; Iwano, Hideki*; Danhara, Toru*
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Amamiya, Hiroki; Niwa, Masakazu; Yonaga, Yusuke; Horiuchi, Yasuharu*
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Yonaga, Yusuke; Sano, Naomi; Shimizu, Mayuko; Amamiya, Hiroki; Ueki, Tadamasa; Niwa, Masakazu
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Sueoka, Shigeru; Komatsu, Tetsuya; Matsushi, Yuki*; Yonaga, Yusuke; Sano, Naomi; Hirao, Noriaki*; Ueki, Tadamasa; Fujita, Natsuko; Kokubu, Yoko; Niwa, Masakazu
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Yonaga, Yusuke; Sano, Naomi*; Amamiya, Hiroki*; Niwa, Masakazu; Yasue, Kenichi*
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no abstracts in English
Matsushi, Yuki*; Komatsu, Tetsuya; Sueoka, Shigeru; Yonaga, Yusuke; Ogawa, Yumi*; Fujita, Natsuko; Kokubu, Yoko
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no abstracts in English