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Journal Articles

Evaluation of soft errors using nuclear probes in SOI SRAM with body-tie structure fabricated by partial trench isolation

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Onoda, Shinobu; Makino, Takahiro; Hirao, Toshio; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*; Takai, Mikio*

Proceedings of 9th International Workshop on Radiation Effects on Semiconductor Devices for Space Applications (RASEDA-9), p.72 - 75, 2010/10

no abstracts in English

Oral presentation

Observation of the SEU in the SOI devices induced by microbeam irradiation

Hirao, Toshio; Abo, Satoshi*; Onoda, Shinobu; Masuda, Naoyuki*; Makino, Takahiro; Oshima, Takeshi; Takai, Mikio*

no journal, , 

no abstracts in English

Oral presentation

Soft error rate in SOI SRAM with technology node of 90 nm using oxygen ion probe

Abo, Satoshi*; Masuda, Naoyuki*; Wakaya, Fujio*; Takai, Mikio*; Hirao, Toshio; Onoda, Shinobu; Makino, Takahiro; Oshima, Takeshi; Iwamatsu, Toshiaki*; Oda, Hidekazu*

no journal, , 

no abstracts in English

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