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Journal Articles

Neutron diffraction measurements of internal strain in Nb$$_{3}$$Sn cable-in-conduit conductors

Hemmi, Tsutomu; Harjo, S.; Ito, Takayoshi; Matsui, Kunihiro; Nunoya, Yoshihiko; Koizumi, Norikiyo; Takahashi, Yoshikazu; Nakajima, Hideo; Aizawa, Kazuya; Suzuki, Hiroshi; et al.

IEEE Transactions on Applied Superconductivity, 21(3), p.2028 - 2031, 2011/06

 Times Cited Count:10 Percentile:49.97(Engineering, Electrical & Electronic)

Residual strain in conductors is caused by the difference in the coefficient of expansion between Nb$$_{3}$$Sn strands and the jacket over a temperature range of 5 - 923 K. The superconducting properties of strands vary significantly, depending on the strain. It is important to clarify the residual strain as part of the evaluation of superconducting performance. However, the residual strain of strands in the conductor has not been measured so far because of their complicated configuration and their location in a jacket. The engineering materials diffractometer "Takumi" in J-PARC can measure residual strain with a relative accuracy of around 0.02%, using neutron diffraction. In this study, the Takumi was applied to the measurement of residual strain in strands for the ITER TF conductor. Results indicate that the residual strain of strands in the conductor can be determined, thereby clarifying the mechanism of residual strain and its relationship to superconducting performance.

Oral presentation

Strain measurements of superconducting filaments and Ag-alloy using neutron diffraction in Ag-sheathed Bi2223 tapes

Machiya, Shutaro; Osamura, Kozo*; Suzuki, Hiroshi; Shiota, Yoshinori*; Ayai, Naoki*; Hayashi, Kazuhiko*; Sato, Kenichi*

no journal, , 

In situ strain measurement was made for inner Bi2223 filaments and outer Ag alloy in the Ag-sheathed Bi2223 tapes using neutron diffraction. The residual strain and the strain response under the axial tensile loading were measured in the Ag-sheathed Bi2223 tapes stacked with 10 sheets.

Oral presentation

Strain measurements of superconducting filaments and Ag-alloy using neutron diffraction in Ag-sheathed BSCCO Bi2223 tapes

Machiya, Shutaro; Osamura, Kozo*; Suzuki, Hiroshi; Ayai, Naoki*; Hayashi, Kazuhiko*; Sato, Kenichi*; Kato, Takeshi*

no journal, , 

no abstracts in English

Oral presentation

Residual stress estimation of Ag-sheathed Bi2223 tapes using Neutron and X-ray diffraction

Machiya, Shutaro; Osamura, Kozo*; Suzuki, Hiroshi; Ayai, Naoki*; Kato, Takeshi*; Hayashi, Kazuhiko*; Sato, Kenichi*

no journal, , 

no abstracts in English

Oral presentation

Strain measurements plan of the qualification sample for ITER CS using neutron diffraction

Hemmi, Tsutomu; Matsui, Kunihiro; Hase, Takashi*; Koizumi, Norikiyo; Takahashi, Yoshikazu; Okuno, Kiyoshi; Suzuki, Hiroshi; Harjo, S.; Aizawa, Kazuya; Tsuchiya, Yoshinori*; et al.

no journal, , 

JAEA is responsible for the procurement of the CS conductor of the ITER magnet system. In order to start the procurement of the CS conductor, the performance of the CS conductor have to be demonstrated. The qualification sample has been fabricated for the test using SULTAN apparatus at the Plasma Physics Research Centre (CRPP) of the Swiss Federal Institute of Technology of Lausanne (EPFL). In this presentation, the design and the fabrication of the qualification sample is reported. The residual strain should be controlled for the measurement of the correct performance. The neutron diffraction will be applied to the direct measurement of the strain of the superconducting cable. This plan is also presented.

Oral presentation

Residual strain estimation of CICC for ITER TF using neutron diffraction

Machiya, Shutaro*; Osamura, Kozo*; Hemmi, Tsutomu; Matsui, Kunihiro; Suzuki, Hiroshi; Tsuchiya, Yoshinori*

no journal, , 

no abstracts in English

Oral presentation

Neutron diffraction measurement of internal strain in ITER TF conductor

Hemmi, Tsutomu; Harjo, S.; Matsui, Kunihiro; Nunoya, Yoshihiko; Koizumi, Norikiyo; Nakajima, Hideo; Ito, Takayoshi; Aizawa, Kazuya; Suzuki, Hiroshi; Machiya, Shutaro*; et al.

no journal, , 

Residual strain in conductors is caused by the difference in the coefficient of expansion between strands and the jacket over a temperature range of 5 - 923 K. The properties of strands vary significantly, depending on the residual strain. It is important to clarify the residual strain as part of the evaluation of performance. However, the residual strain of strands in the conductor has not been measured so far because of their complicated configuration and their location in a jacket. The engineering materials diffractometer "Takumi" in J-PARC can measure residual strain using neutron diffraction. In this study, neutron diffraction using the Takumi was applied to the measurement of residual strain in strands for the ITER TF conductor. Results indicate that the residual strain of strands in the conductor can be determined, thereby clarifying the mechanism of residual strain and its relationship to performance.

Oral presentation

Neutron diffraction study of internal strain in Nb$$_{3}$$Sn Cable-In-Conduit Conductors

Hemmi, Tsutomu; Harjo, S.; Nunoya, Yoshihiko; Kajitani, Hideki; Koizumi, Norikiyo; Nakajima, Hideo; Aizawa, Kazuya; Machiya, Shutaro*; Osamura, Kozo*

no journal, , 

Internal strain in Cable-In-Conduit Conductors (CICC) is caused by differences in the coefficients of thermal expansion between Nb$$_{3}$$Sn strands and the stainless steel jacket over a temperature range of 5 - 923 K. In addition, transverse electromagnetic loading is generated by a current of 68 kA and a magnetic field of 11.8 T in the case of ITER TF coils. The performances of Nb$$_{3}$$Sn strands change significantly, depending on the presence of strain. The presence of internal strain in Nb$$_{3}$$Sn cables is important to evaluate the superconducting performance. However, the strain of strands in the conductor has not been measured so far because of the cabling configuration and their location in a jacket. Internal strain can be determined by neutron diffraction measurement using Takumi of J-PARC. Test results of the neutron diffraction and the role of the neutron diffraction measurement for the investigation of Tcs degradation of short conductor sample will be presented and discussed.

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