Coherent X-ray diffraction for domain observation

Owada, Kenji; Namikawa, Kazumichi; Mizuki, Junichiro; Shimomura, Susumu*; Nakao, Hironori*; Ito, Kazuki*; Matsushita, Mitsuyoshi*; Yoneda, Yasuhiro; Murakami, Yoichi*; Hirota, Kazuma*

Transactions of the Materials Research Society of Japan, 32(1), p.7 - 10, 2007/03

An X-ray speckle pattern well reflects a particle or domain alignment on the inside of materials. Detecting the alignment is important for understanding a function of the materials such as ferroelectric, piezoelectric materials, photonic crystals and so on. We have thus constructed the apparatus for coherent X-ray diffraction at BL22XU@SPring-8, high quality slits for obtaining the full coherent X-ray beam, high resolution X-ray CCD camera for obtaining the well-resolved speckle pattern, and so on. By using the devices, we have successfully observed the speckle pattern from CuAu, the ferroelectric material PZN-9%PT (91%Pb(ZnNb)O-9%PbTiO) and Sr-doped BaTiO. The 2DFFT image gives us a spatial autocorrelation function which includes the information of the arrangement of the domains in the crystal within micrometers scale.