Real-time observation of rotational twin formation during molecular-beam epitaxial growth of GaAs on Si (111) by X-ray diffraction

Suzuki, Hidetoshi*; Nakata, Yuka*; Takahashi, Masamitsu; Ikeda, Kazuma*; Oshita, Yoshio*; Morohara, Osamu*; Geka, Hirotaka*; Moriyasu, Yoshitaka*

AIP Advances (Internet), 6(3), p.035303_1 - 035303_6, 2016/03

https://doi.org/10.1063/1.4943511

Theoretical optimization of base doping concentration for radiation resistance of InGaP subcells of InGaP/GaAs/Ge based on minority-carrier lifetime

Elfiky, D.*; Yamaguchi, Masafumi*; Sasaki, Takuo*; Takamoto, Tatsuya*; Morioka, Chiharu*; Imaizumi, Mitsuru*; Oshima, Takeshi; Sato, Shinichiro; Elnawawy, M.*; Eldesoky, T.*; et al.

Japanese Journal of Applied Physics, 49(12), p.121201_1 - 121201_7, 2010/12

https://doi.org/10.1143/JJAP.49.121201

One of the fundamental objectives for research and development of space solar cells is to improve their radiation resistance. InGaP solar cells with low base carrier concentrations under low-energy proton irradiations have shown high radiation resistances. In this study, an analytical model for low-energy proton radiation damage to InGaP subcells based on a fundamental approach for radiative and nonradiative recombinations has been proposed. The radiation resistance of InGaP subcells as a function of base carrier concentration has been analyzed by using the radiative recombination lifetime and damage coefficient K for the minority-carrier lifetime of InGaP. Numerical analysis shows that an InGaP solar cell with a lower base carrier concentration is more radiation-resistant. Satisfactory agreements between analytical and experimental results have been obtained, and these results show the validity of the analytical procedure. The damage coefficients for minority-carrier diffusion length and carrier removal rate with low-energy proton irradiations have been observed to be dependent on carrier concentration through this study. As physical mechanisms behind the difference observed between the radiation-resistant properties of various base doping concentrations, two mechanisms, namely, the effect of a depletion layer as a carrier collection layer and generation of the impurity-related complex defects due to low-energy protons stopping within the active region, have been proposed.

Study the effects of proton irradiation on GaAs/Ge solar cells

Elfiky, D.*; Yamaguchi, Masafumi*; Sasaki, Takuo*; Takamoto, Tatsuya*; Morioka, Chiharu*; Imaizumi, Mitsuru*; Oshima, Takeshi; Sato, Shinichiro; Elnawawy, M.*; Eldesuky, T.*; et al.

Proceedings of 35th IEEE Photovoltaic Specialists Conference (PVSC-35) (CD-ROM), p.002528 - 002532, 2010/06

https://doi.org/10.1109/PVSC.2010.5614633

Proton energy dependence of radiation damage to GaAs/Ge solar cells irradiated with protons with various energies (50 keV, 200 keV, 1 MeV and 9.5 MeV) were analyzed by using PC1D simulation together with SRIM simulations to investigate their electrical properties. The degradation of the open-circuit voltage is highest for 50 keV irradiation and lowest for 9.5 MeV irradiation. According to SRIM simulations the above changes in electrical properties are mainly related to damage in different regions of the solar sells.

Electron radiation induced defects in lattice-mismatched solar cells

Sasaki, Takuo*; Ekins-Daukes, N. J.*; Lee, H. S.*; Takamoto, Tatsuya*; Imaizumi, Mitsuru*; Oshima, Takeshi; Ito, Hisayoshi; Yamaguchi, Masafumi*

JAEA-Review 2006-042, JAEA Takasaki Annual Report 2005, P. 7, 2007/02

https://jopss.jaea.go.jp/pdfdata/JAEA-Review-2006-042.pdf

no abstracts in English

Analysis for radiation-resistance of InGaP and GaAs sub-cells for InGaP/GaAs/Ge 3-junction solar cells

Yamaguchi, Masafumi*; Ekins-Daukes, N. J.*; Lee, H. S.*; Sumita, Taishi*; Imaizumi, Mitsuru*; Takamoto, Tatsuya*; Agui, Takaaki*; Kaneiwa, Minoru*; Kamimura, Kunio*; Oshima, Takeshi; et al.

Proceedings of 2006 IEEE 4th World Conference on Photovoltaic Energy Conversion (WCPEC-4) (CD-ROM), p.1789 - 1792, 2006/05

no abstracts in English

Effects of a low-energy proton irradiation on n/p-AlInGaP solar cells

Lee, H. S.*; Yamaguchi, Masafumi*; Ekins-Daukes, N. J.*; Khan, A.*; Takamoto, Tatsuya*; Imaizumi, Mitsuru*; Oshima, Takeshi; Ito, Hisayoshi

Physica B; Condensed Matter, 376-377, p.564 - 567, 2006/04

https://doi.org/10.1016/j.physb.2005.12.142

no abstracts in English

Defect observation of AlInGaP irradiated with 30 keV protons for multi-junction space solar cells

Lee, H. S.*; Ekins-Daukes, N. J.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; Imaizumi, Mitsuru*; et al.

Proceedings of 31st IEEE Photovoltaic Specialists Conference and Exhibition (PVSC-31), p.556 - 558, 2005/00

no abstracts in English

Carrier removal and defect generation in lattice-mismatched InGaP under 1 MeV electron irradiation

Ekins-Daukes, N. J.*; Lee, H. S.*; Sasaki, Takuo*; Yamaguchi, Masafumi*; Khan, A.*; Takamoto, Tatsuya*; Agui, Takaaki*; Kamimura, Kunio*; Kaneiwa, Minoru*; Imaizumi, Mitsuru*; et al.

Proceedings of the 6th International Workshop on Radiation Effects on Semiconductor Devices for Space Application (RASEDA-6), p.87 - 91, 2004/10

no abstracts in English

Extraction of hydrogen-atom positions in polyethylene crystal lattice from wide-angle neutron diffraction data collected by a two-dimensional imaging plate system; Comparison with the X-ray and electron diffraction results

Tashiro, Koji*; Tanaka, Ichiro*; Ohara, Takashi; Niimura, Nobuo*; Fujiwara, Satoru; Kamae, Toshiya*

Macromolecules, 37(11), p.4109 - 4117, 2004/06

https://doi.org/10.1021/ma036003o

Two-dimensional wide-angle neutron diffraction patterns have been measured successfully for uniaxially oriented fully deuterated and fully hydrogeneous polyethylene samples by using an imaging plate system (BIX-3) installed at the Japan Atomic Energy Research Institute. The detailed data analysis allowed us to extract the positions of hydrogen atoms in the crystal lattice accurately. The results were compared quantitatively with those obtained from the X-ray and electron diffraction experiments as well as the computer simulation result.

Majority- and minority-carrier deep level traps in proton-irradiated -InGaP space solar cells

Dharmarasu, N.*; Yamaguchi, Masafumi*; Bourgoin, J. C.*; Takamoto, Tatsuya*; Oshima, Takeshi; Ito, Hisayoshi; Imaizumi, Mitsuru*; Matsuda, Sumio*

Applied Physics Letters, 81(1), p.64 - 66, 2002/07

https://doi.org/10.1063/1.1491005

We studied the properties of observed defects in n/p-InGaP solar cells created by irradiation of protons with different energies.Three majority (hole) and a minority-carrier traps, labeled respectively as HP1 (E+0.900.05eV), HP2 (E+0.730.05eV), H2 (E +0.55eV),and EP1 (E 0.54eV),were identified using deep level transient spectroscopy. All majority-carrier traps were found to act as recombination centers. While the H2 traps present in the proton-irradiated p-InGaP was found to anneal out by minority-carrier injection, the other traps were not.