A System for ultra-fast transient ion and pulsed laser current microscopies as a function of temperature

Laird, J. S.; Hirao, Toshio; Onoda, Shinobu*; Mori, Hidenobu*; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	Solid State Phenomena Vol.78-79
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Pages	:	p.401 - 406
Publication Year/Month	:	2001/07
Meeting title	:	6th International Workshop on Beam Injection Assessment of Microstructures in Semiconductors
Held date	:	2000/11
Location (city)	:	Fukuoka
Location (country)	:	Japan
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Keywords	:	マイクロイオンビーム; TIBIC; LBIC; ピコレーザ; SEU; DLTS
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Registration No. : B20001500
JAEA Abstracts No. : 290836
Paper Submission No. : 18372

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