Total-electron-yield X-ray standing-wave measurements of multilayer X-ray mirrors for interface structure evaluation

Muramatsu, Yasuji; Takenaka, Hisataka*; Gullikson, E. M.*; Perera, R. C. C.*

no abstracts in English

Language	:	English
Journal	:	Japanese Journal of Applied Physics, Part 1
Volume	:	41
Number	:	6B
Pages	:	p.4250 - 4252
Publication Year/Month	:	2002/06
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Paper URL	:	https://doi.org/10.1143/JJAP.41.4250
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Keywords	:	放射光; X線定在波; 界面; 多層膜
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Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:38.06 Category:Physics, Applied
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Registration No. : A20010055
JAEA Abstracts No. : 301144
Paper Submission No. : 19568

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