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Defects in 30 keV Er$$^{+}$$-implanted SiO$$_{2}$$/Si studied by positron annihilation and cathodoluminescence

Hirata, Koichi*; Arai, Hideyuki*; Kawasuso, Atsuo; Sekiguchi, T.*; Kobayashi, Yoshinori*; Okada, Sohei

no abstracts in English

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Category:Physics, Applied

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