TEM analyses of surface ridge network in an ion-irradiated graphite thin film

Muto, Shunsuke*; Tanabe, Tetsuo*; not registered; not registered; Furuno, Shigemi*; Hojo, Kiichi

no abstracts in English

Language	:	English
Journal	:	Journal of Nuclear Materials
Volume	:	271-272
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Pages	:	p.285 - 289
Publication Year/Month	:	1999/00
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Paper URL	:	https://doi.org/10.1016/S0022-3115(98)00715-6
DOI for research data	:
Keywords	:	TEM; 電子励起; ヘリウムイオン; 注入; グラファイト; 構造変化
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:40.64 Category:Materials Science, Multidisciplinary
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Registration No. : A19990243
JAEA Abstracts No. : 271279
Paper Submission No. : 17014

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