Recent studies of single-event phenomena in devices using the heavy-ion microbeam at JAERI

Hirao, Toshio; Laird, J. S.; Mori, Hidenobu; Onoda, Shinobu; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	Proceedings of 6th European Conference on Radiation and its Effects on Components and System (RADECS 2001) (CD-ROM)
Volume	:
Number	:
Pages	:	5 Pages
Publication Year/Month	:	2002/00
Meeting title	:	6th European Conference on Radiation and its Effects on Components and System (RADECS 2001)
Held date	:	2001/09
Location (city)	:	Grenoble
Location (country)	:	France
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	シングルイベント現象; イオン照射; マイクロビーム; 過渡電流; 電荷収集
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : B20011032
JAEA Abstracts No. : 301094
Paper Submission No. : 19531

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.