Development of a multi-channel X-ray monitor system for the JFT-2M tokamak

no abstracts in English

Language	:	Japanese
Report No.	:	JAERI-Tech 99-070
Pages	:	p.19 - 0
Publication Year/Month	:	1999/09
Patent information	:
PDF	:	JAERI-Tech-99-070.pdf:3.05MB
Paper URL	:	https://doi.org/10.11484/jaeri-tech-99-070
Keywords	:	JFT-2M; プラズマ放電; X線; 逃走電子; 許容線量; 電離箱型検出器; プラズマ制御; X線モニターシステム
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:
Other institute's report number	:

Acecsses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count: If you would like to get the latest times cited,please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : T19990070
JAEA Abstracts No. : 271152

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.