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NEXAFSによる窒化炭素薄膜の局所構造解析

Local structures analysis of carbon nitride films by utilizing NEXAFS spectroscopy

下山 巖

Shimoyama, Iwao

窒化炭素はダイヤモンドを越える超硬物質となる可能性が指摘されており、その合成が盛んに試みられているが、合成された材料の原子レベルでの構造はまだ不明な点が多い。われわれのグループでは放射光の偏光特性を用いて窒化炭素薄膜の原子レベルの局所構造を調べ、薄膜中にC≡N三重結合をもつシアン構造、C=Nに重結合をもつピリジン構造,グラファイトのCがNで置換されたグラファイト構造の3つが存在することを明らかにした。本論文では窒化炭素薄膜の局所構造解析に用いた吸収端近傍X線吸収微細構造(NEXAFS)の手法と結果を詳しく解説するとともに、X線光電子分光法(XPS)との比較からその有用性について論じた。

Since the prediction of the possibility that carbon nitride would have super hard property which exceeds that of diamond, considerable efforts to synthesize this material have been employed. However, local structures in carbon nitride films synthesized have not been revealed enough. We study the local structures utilizing synchrotron radiation and revealed the existence of three kinds of local structures in carbon nitride films, i.e., cyanic structure which has C≡N triple bond, pyridine-like structure which has C=N double bond, and graphite-like structure in which carbon atom is substituted by nitrogen atom in graphite network. In this article, I explain the method of near edge X-ray absorption fine structure (NEXAFS) that we used for this study, and from the comparison with x-ray photoelectron spectroscopy (XPS), I comment the availability of NEXAFS to study the local structures in new materials.

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