Consistency of bulk damage factor and NIEL for electrons, protons, and heavy ions in Si CCDs

Kuboyama, Satoshi*; Shindo, Hiroyuki*; Hirao, Toshio; Matsuda, Sumio*

no abstracts in English

Language	:	English
Journal	:	IEEE Transactions on Nuclear Science
Volume	:	49
Number	:	6
Pages	:	p.2684 - 2689
Publication Year/Month	:	2002/12
Meeting title	:	2002 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2002)
Held date	:	2002/07
Location (city)	:	Phoenix
Location (country)	:	U. S. A.
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1109/TNS.2002.805360
DOI for research data	:
Keywords	:	CCD(電荷結合型デバイス); NIEL; 欠陥; PKA(一次はじき出し原子); カスケード
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	宇宙開発事業団

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:54.86 Category:Engineering, Electrical & Electronic
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Registration No. : B20020522
JAEA Abstracts No. : 49000030
Paper Submission No. : 23659

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