Language |
: | English |
---|---|---|
Journal |
: | |
Volume |
: | 47 |
Number |
: | 3 |
Pages |
: | p.218 - 223 |
Publication Year/Month |
: | 1997/00 |
Paper URL |
: |
|
Keywords |
: | Thermal Annealing; Isochronal Annealing; MOS; 3C-SiC; SiC; Gamma-rays; C-V; Interface Trap; Oxide-trapped Charges |
Accesses |
: |
- Accesses |
---|---|---|
InCites™ |
: |
Percentile:11.83 Category:Materials Science, Multidisciplinary |
Altmetrics |
: |
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