EELS analysis of SiC crystals under hydrogen and helium dual-ion beam irradiation

Hojo, Kiichi; not registered; Furuno, Shigemi; Kushita, Kohei; not registered; Sasajima, Naohiko*

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	141
Number	:	1-4
Pages	:	p.148 - 153
Publication Year/Month	:	1998/00
Meeting title	:	Radiation Effects in Insulators-9 (REI-9)
Held date	:	1997/09
Location (city)	:	America
Location (country)	:
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/S0168-583X(98)00181-5
DOI for research data	:
Keywords	:	SiC; 高分解能EELS; イオン照射; 構造変化
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:89.58 Category:Instruments & Instrumentation
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Registration No. : B19970756
JAEA Abstracts No. : 261011
Paper Submission No. : 15931

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