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Generation mechanisms of trapped charges in oxide layers of 6H-SiC MOS structures irradiated with $$gamma$$-rays

Yoshikawa, Masahito; not registered; Oshima, Takeshi; Ito, Hisayoshi; Nashiyama, Isamu; not registered; Onishi, K.*; Okumura, Hajime*; Yoshida, Sadafumi*

no abstracts in English



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