Incident angle dependence of residual defect in silicon surface barrier detector

Kanno, Ikuo; Ikezoe, Hiroshi; Otsuki, Tsutomu*; not registered; not registered; Kimura, Itsuro*

no abstracts in English

Language	:	English
Journal	:	Journal of Nuclear Science and Technology
Volume	:	28
Number	:	6
Pages	:	p.582 - 584
Publication Year/Month	:	1991/06
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Paper URL	:	https://doi.org/10.3327/jnst.28.582
DOI for research data	:
Keywords	:	Silicon Surface Barrier Detector; Pulse Height Defect; Residual Defect; Plasma Column; Depletion Layer; Dielectricity; Incident Angle Dependence
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Registration No. : A19900467
JAEA Abstracts No. : 190580
Paper Submission No. : 10463

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