Oxygen microclusters in Czochralski-grown Si probed by positron annihilation

Uedono, Akira*; not registered; L.Wei*; not registered; not registered; not registered; Ito, Hisayoshi

no abstracts in English

Language	:	English
Journal	:	Japanese Journal of Applied Physics
Volume	:	33
Number	:	8B
Pages	:	p.L1131 - L1134
Publication Year/Month	:	1994/08
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Paper URL	:	https://doi.org/10.1143/JJAP.33.L1131
DOI for research data	:
Keywords	:	陽電子消滅; 寿命; Si; 欠陥; 酸素
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:17.87 Category:Physics, Applied
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Registration No. : A19930556
JAEA Abstracts No. : 220725
Paper Submission No. : 12647

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