A New system for in-situ observation of dynamic process of structural and chemical changes during dual ion irradiation in a 400kV electron microscope

Furuno, Shigemi; Hojo, Kiichi; not registered; not registered; Sasaki, Teikichi; not registered; not registered

no abstracts in English

Language	:	English
Journal	:	Electron Microscopy 1990,Vol. 4
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Pages	:	p.538 - 539
Publication Year/Month	:	1990/00
Meeting title	:	12th Int. Congress for Electron Microscopy
Held date	:	1990/08
Location (city)	:	America
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Patent information	:
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DOI for research data	:
Keywords	:	二重イオン照射; その場観察; EELS分析; 電子顕微鏡
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Registration No. : B19900046
JAEA Abstracts No. : 190451
Paper Submission No. : 10360

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