Submicron microbeam apparatus using a single-ended accelerator with very high voltage stability

Kamiya, Tomihiro; Suda, Tamotsu*; Tanaka, Ryuichi

no abstracts in English

Language	:	English
Journal	:	Nuclear Instruments and Methods in Physics Research B
Volume	:	104
Number	:
Pages	:	p.43 - 48
Publication Year/Month	:	1995/09
Meeting title	:	4th International Conference on Nuclear Microprobe Technology and Applications
Held date	:	1994/10
Location (city)	:
Location (country)	:	China
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/0168-583X(95)00399-1
DOI for research data	:
Keywords	:	軽イオンマイクロビーム; 3MVシングルエインド加速器; イオンビーム分析; 2MeVヘリウム; ビームサイズ; ビーム電流; サブミクロン; ビーム光学設計
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:96.5 Category:Instruments & Instrumentation
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Registration No. : B19941051
JAEA Abstracts No. : 47001015
Paper Submission No. : 21652

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