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Inferring $$Z_{eff}$$ spatial profile from background light in incoherent Thomson scattering diagnostic

Naito, Osamu; Hatae, Takaki

A simulation study on the feasibility of inferring spatial $$Z_{eff}$$ profile along with electron temperature and density in Thomson scattering diagnostic is presented. The background signal, which is usually discarded after subtracted from the Thomson scattered signal, is used in the reconstruction procedure. If the contribution from line radiation to the background signal is by one order of magnitude smaller than that from bremsstrahlung, a fairly accurate $$Z_{eff}$$ profile can be reconstructed.



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