Bulk damage caused by single protons in SDRAMs

Shindo, Hiroyuki*; Kuboyama, Satoshi*; Ikeda, Naomi*; Hirao, Toshio; Matsuda, Sumio*

no abstracts in English

Language	:	English
Journal	:	IEEE Transactions on Nuclear Science
Volume	:	50
Number	:	6, Part1
Pages	:	p.1839 - 1845
Publication Year/Month	:	2003/12
Meeting title	:	40th Annual International Nuclear & Space Radiation Effects Conference
Held date	:	2003/07
Location (city)	:	Monterey
Location (country)	:	U. S. A.
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1109/TNS.2003.820727 Read or search this article
Keywords	:	バルク損傷; シングルプロトン; SDRAM; 断面積
Research Facility	:	TIARA(イオン照射研究施設)
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:	宇宙開発事業団

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:68.9 Category:Engineering, Electrical & Electronic
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Registration No. : B20030424
JAEA Abstracts No. : 48000010
Paper Submission No. : 22373

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