Electronic structures of ultra-thin silicon carbides deposited on graphite

Baba, Yuji ; Sekiguchi, Tetsuhiro ; Shimoyama, Iwao ; Nath, K. G.

no abstracts in English

Language	:	English
Journal	:	Applied Surface Science
Volume	:	234
Number	:	1-4
Pages	:	p.246 - 250
Publication Year/Month	:	2004/07
Meeting title	:	9th International Conference on the Formation of Semiconductor Interfaces (ICFSI-9)
Held date	:	2003/09
Location (city)	:	Madrid
Location (country)	:	Spain
Patent information	:
PDF	:
Paper URL	:	https://doi.org/10.1016/j.apsusc.2004.05.045
DOI for research data	:	Link to research data related to this paper/report.
Keywords	:	Silicon Carbide; XPS; XANES; Two-dimensional Layer; Synchrotron Radiation; Polarization Dependence
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Article of JAEA R&D Review	:
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:46.13 Category:Chemistry, Physical
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Registration No. : B20030624
JAEA Abstracts No. : 320801
Paper Submission No. : 21215

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