3MeV electron irradiation-induced defects in CuInSe $_{2}$ thin films

Lee, H.-S.*; Okada, Hiroshi*; Wakahara, Akihiro*; Oshima, Takeshi; Ito, Hisayoshi; Kawakita, Shiro*; Imaizumi, Mitsuru*; Matsuda, Sumio*; Yoshida, Akira*

no abstracts in English

Language	:	English
Journal	:	Journal of Physics and Chemistry of Solids
Volume	:	64
Number	:	9-10
Pages	:	p.1887 - 1890
Publication Year/Month	:	2003/09
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Paper URL	:	https://doi.org/10.1016/S0022-3697(03)00109-4
DOI for research data	:
Keywords	:	CuInSe $_{2}$ ; 電子線照射; キャリア濃度; キャリアリムーバルレート; 欠陥エネルギー準位
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Cooperating Institute	:	豊橋技術科学大学

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InCites™	:	Percentile:53.9 Category:Chemistry, Multidisciplinary
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Registration No. : A20030469
JAEA Abstracts No. : 320508
Paper Submission No. : 20956

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3MeV electron irradiation-induced defects in CuInSe thin films

3MeV electron irradiation-induced defects in CuInSe $_{2}$ thin films