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Characterization of surface carbon films on weathered Japanese roof tiles by soft X-ray spectroscopy

軟X線分光法によるいぶし瓦表面炭素の劣化評価

村松 康司; 山下 満*; 元山 宗之*; 広瀬 美佳*; Denlinger, J. D.*; Gullikson, E. M.*; Perera, R. C. C.*

Muramatsu, Yasuji; Yamashita, Michiru*; Motoyama, Muneyuki*; Hirose, Mika*; Denlinger, J. D.*; Gullikson, E. M.*; Perera, R. C. C.*

軟X線分光法を用いて、いぶし瓦表面炭素膜の耐候性を調べた。軟X線吸収分光測定から、炭素膜の表面では酸化反応が進行し、この酸化状態は主としてカルボキシル基の形成で説明できた。軟X線発光分光測定から、数年程度の外部環境被爆では炭素膜内部の層構造は乱れないことがわかった。以上から、いぶし瓦の耐候性は自然酸化反応が炭素膜の表面から進行することで理解できた。

Surface carbon films on the weathered Japanese roof tiles were characterized by soft X-ray spectroscopy. From the X-ray absorption measurements, it was confirmed that the surface carbon films were oxidized by weathering. On the ohterhand, from the X-ray emission measurements, it can be confirmed that the degree of the orientation was kept in the inner carbon films.

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分野:Spectroscopy

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