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Scaling behavior in the Ce-based Kondo semiconductors; NQR/NMR measurements of CeRhSb and CeNiSn under high pressures

Ikushima, Kenji; Yasuoka, Hiroshi; Uwatoko, Yoshiya*; Ishikawa, Yoshikazu*

no abstracts in English

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Category:Materials Science, Multidisciplinary

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