Negative-U-centers in 4H- and 6H-SiC detected by spectral light excitation

Weidner, M.*; Pensl, G.*; Nagasawa, Hiroyuki*; Schner, A.*; Oshima, Takeshi

no abstracts in English

Language	:	English
Journal	:	Materials Science Forum
Volume	:	457-460
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Pages	:	p.485 - 488
Publication Year/Month	:	2004/10
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Keywords	:	炭化ケイ素(SiC); 光照射下DLTS; 欠陥中心; ネガティブU中心
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Registration No. : A20040390
JAEA Abstracts No. : 330279
Paper Submission No. : 21660

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