Energy loss of 1000keV electrons in thin silicon crystals as measured by high voltage electron microscopy

not registered; Izui, Kazuhiko; not registered; not registered

no abstracts in English

Language	:	English
Journal	:	Radiat.Eff.
Volume	:	26
Number	:	1-2
Pages	:	p.129 - 133
Publication Year/Month	:	1975/02
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DOI for research data	:
Keywords	:	High energy electrons; HVEM; Energy loss; Plasmon; L-shell electron; Mean free path; Silicon
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Accesses	:	- Accesses
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Registration No. : A19744493
JAEA Abstracts No. :
Paper Submission No. : 4387

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