High resolution structure images and their application to defect studies

Izui, Kazuhiko; not registered; not registered; not registered

no abstracts in English

Language	:	English
Journal	:	Chem.Scr.
Volume	:	14
Number	:	1-5
Pages	:	p.99 - 108
Publication Year/Month	:	1979/00
Meeting title	:
Held date	:
Location (city)	:
Location (country)	:
Patent information	:
PDF	:
Paper URL	:
DOI for research data	:
Keywords	:	結晶構造像; 電子顕微鏡; 格子欠陥
Research Facility	:
Press Release	:
Article of JAEA R&D Review	:
Cooperating Institute	:

Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:
Altmetrics	:

Registration No. : A19799248
JAEA Abstracts No. :
Paper Submission No. : 5696

[CLARIVATE ANALYTICS], [WEB OF SCIENCE], [HIGHLY CITED PAPER & CUP LOGO] and [HOT PAPER & FIRE LOGO] are trademarks of Clarivate Analytics, and/or its affiliated company or companies, and used herein by permission and/or license.