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Radiation loss by impurities measured from the large helical device

Kato, Takako*; Murakami, Izumi*; Goto, Motoshi*; Morita, Shigeru*; Ida, Katsumi*; Peterson, B. J.*; Funaba, Hisamichi*; Nakano, Tomohide

We analyzed impurity VUV spectral emission quantitatively. Electron temperature is derived from the intensity ratio of CIII line intensities. Radiation loss sources are identified using spectroscopy and bolometer in the case of radiation collapse caused by neon gas puffing. Time dependent radiation loss of impurity ions are derived from line intensities of impurities.



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