Radiation loss by impurities measured from the large helical device

Kato, Takako*; Murakami, Izumi*; Goto, Motoshi*; Morita, Shigeru*; Ida, Katsumi*; Peterson, B. J.*; Funaba, Hisamichi*; Nakano, Tomohide

We analyzed impurity VUV spectral emission quantitatively. Electron temperature is derived from the intensity ratio of CIII line intensities. Radiation loss sources are identified using spectroscopy and bolometer in the case of radiation collapse caused by neon gas puffing. Time dependent radiation loss of impurity ions are derived from line intensities of impurities.

Language	:	English
Journal	:	Journal of Plasma and Fusion Research SERIES, Vol.7
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Pages	:	p.1 - 4
Publication Year/Month	:	2006/00
Meeting title	:	Joint Meeting of 14th International Toki Conference on Plasma Physics and Controlled Nuclear Fusion (ITC-14) & 4th International Conference on Atomic and Molecular Data and Their Applications (ICAMDATA 2004)
Held date	:	2004/10
Location (city)	:	Toki
Location (country)	:	Japan
Patent information	:
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DOI for research data	:
Keywords	:	VUV Spectra; Impurity; Radiation; Ne VII; C III
Research Facility	:
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Article of JAEA R&D Review	:
Cooperating Institute	:	核融合科学研究所

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Registration No. : B20041426
JAEA Abstracts No. : 34000861
Paper Submission No. : 986

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