XPS and TDS studies of trapping states of helium implanted in TiO $_{2}$

not registered ; not registered

no abstracts in English

Language	:	English
Journal	:	Journal of Nuclear Materials
Volume	:	152
Number	:
Pages	:	p.295 - 300
Publication Year/Month	:	1988/00
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Paper URL	:	https://doi.org/10.1016/0022-3115(88)90340-6 Read or search this article
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Keywords	:	X-ray Photoelectron Spectroscopy; Thermal Desorption Spectrometry; He $^{+}$ -ion Bombardment; TiO $_{2}$ ; Activation Energy; Trapping State
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:46.89 Category:Materials Science, Multidisciplinary
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Registration No. : A19866522
JAEA Abstracts No. :
Paper Submission No. : 8738

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