Molecular effect of Al K $_{alpha}$ X-ray yields from aluminum oxide films for H $^{+}$ and H $^{+}$ $_{2}$ ion bombardments

not registered; not registered; not registered; Kawatsura, Kiyoshi; Ozawa, K.; not registered

no abstracts in English

Language	:	English
Journal	:	Phys.Lett.,A
Volume	:	97
Number	:	5
Pages	:	p.191 - 193
Publication Year/Month	:	1983/00
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Keywords	:	Molecular Effect; Al $_{2}$ O $_{3}$ ; K $_{alpha}$ X-ray; Ion Impact
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Registration No. : A19833256
JAEA Abstracts No. :
Paper Submission No. : 6828

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Molecular effect of Al K X-ray yields from aluminum oxide films for H and H ion bombardments

Molecular effect of Al K $_{alpha}$ X-ray yields from aluminum oxide films for H $^{+}$ and H $^{+}$ $_{2}$ ion bombardments