Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques

Hellgren, N.*; Guo, J.*; Luo, Y.*; Sthe, C.*; Agui, Akane; Kashtanov, S.*; Nordgren, J.*; gren, H.*; Sundgren, J.-E.*

no abstracts in English

Language	:	English
Journal	:	Thin Solid Films
Volume	:	471
Number	:	1-2
Pages	:	p.19 - 34
Publication Year/Month	:	2005/01
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Paper URL	:	https://doi.org/10.1016/j.tsf.2004.03.027
DOI for research data	:
Keywords	:	薄膜; 窒化炭素; 軟X線; 発光分光; 光電子分光; 吸収分光
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Accesses	:	- Accesses
Web of Science® Times Cited Count	:	Times Cited Count： If you would like to get the latest times cited, please access the Web of Science®. http://www.webofknowledge.com/wos
InCites™	:	Percentile:96.57 Category:Materials Science, Multidisciplinary
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Registration No. : A20050021
JAEA Abstracts No. : 330395
Paper Submission No. : 21735

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