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Polarizance of a synthetic mica crystal polarizer and the degree of linear polarization of an undulator beamline at 880eV evaluated by the rotating-analyzer method

Imazono, Takashi; Hirono, Toko*; Kimura, Hiroaki*; Saito, Yuji  ; Ishino, Masahiko; Muramatsu, Yasuji*; Koike, Masato; Sano, Kazuo*

Polarizance of a reflection-type polarizer made with a synthetic mica (fluorophlogopite) single crystal was evaluated at the photon energy of 880 eV by means of the rotating-analyzer method in conjunction with the evaluation of the degree of linear polarization of the insertion beamline, SPring-8 BL23SU, featuring an APPLE-2 type variably polarizing undulator. When the undulator was tuned to the horizontal linear polarization mode, the maximum reflectances for s- and p-polarization for a symmetric Bragg reflection of synthetic mica(002) were 2.6% and 0.013%, respectively, at incident angles of near 45$$^circ$$. Our analysis based on the rotating-analyzer method gave the polarizance of the polarizer of at least 0.997 $$pm$$ 0.002 and the degree of linear polarization of 0.993 $$pm$$ 0.004 in the linear polarization mode.



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Category:Instruments & Instrumentation



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