Atomic displacements in electrically conducting ceramics irradiated with high-energy X-ray

Ishikawa, Norito ; Chimi, Yasuhiro; Michikami, Osamu*; Ota, Yasuyuki*; Motohashi, Haruhiko*; Iwase, Akihiro*

Electrically Conducting Ceramics EuBa $_{2}$ Cu $_{3}$ Oy thin film has been irradiated with monocromatic high-energy X-ray with the energy in the range of 5-9keV, and the X-ray energy dependence of the irradiation effect has been investigated. Electrical resistivity increase reflecting lattice defect creation has been observed as a result of X-ray irradiation. Moreover, the increase in the resistivity is found to be determined by the total energy absorbed by the irradiated sample. This result indicates that ionization can create lattice defects even if the ionization density is not high as in the case of high-energy ion irradiation.

Language	:	Japanese
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Meeting title	:	日本物理学会第61回年次大会
Held date	:	2006/03
Location (city)	:	松山
Location (country)	:	日本
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Keywords	:	no keyword
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Registration No. : BB20051196
JAEA Abstracts No. :
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